Patents by Inventor Mitsuhiro Bekku

Mitsuhiro Bekku has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20140002083
    Abstract: A magnetic resonance apparatus configured to select a coil mode that includes a combination of coil elements to be used when a subject is scanned from within a plurality of coil elements and configured to execute a predetermined scan for acquiring data on the subject using the selected coil mode is provided. The magnetic resonance apparatus includes a coil device having n coil modes, a selecting unit configured to select, from within the n coil modes, a candidate for the selected coil mode, a scanning unit configured to execute a first scan for acquiring the data on the subject using the candidate, and a sensitivity map preparing unit configured to prepare a sensitivity map of the candidate based on data obtained by the first scan.
    Type: Application
    Filed: June 28, 2013
    Publication date: January 2, 2014
    Inventors: Yusuke Asaba, Ken Arai, Janeiro Aguilar, Mitsuhiro Bekku, Miho Nagasawa
  • Patent number: 8570041
    Abstract: A magnetic resonance imaging apparatus executes a calibration scan for acquiring calibration data used to correct image data of a subject and an imaging scan for acquiring the image data of the subject and receives magnetic resonance signals using combinations of coil elements selected out of a plurality of coil elements. The magnetic resonance imaging apparatus includes a calibration scan condition determining device for determining a scan condition for the calibration scan, based on a first scan range of the subject taken when the imaging scan is executed and a first combination of coil elements used to receive magnetic resonance signals in the first scan range.
    Type: Grant
    Filed: November 19, 2010
    Date of Patent: October 29, 2013
    Assignee: GE Medical Systems Global Technology Company, LLC
    Inventors: Takeshi Kubota, Mitsuhiro Bekku, Osamu Takayama, Miho Nagasawa
  • Publication number: 20110121831
    Abstract: A magnetic resonance imaging apparatus executes a calibration scan for acquiring calibration data used to correct image data of a subject and an imaging scan for acquiring the image data of the subject and receives magnetic resonance signals using combinations of coil elements selected out of a plurality of coil elements. The magnetic resonance imaging apparatus includes a calibration scan condition determining device for determining a scan condition for the calibration scan, based on a first scan range of the subject taken when the imaging scan is executed and a first combination of coil elements used to receive magnetic resonance signals in the first scan range.
    Type: Application
    Filed: November 19, 2010
    Publication date: May 26, 2011
    Inventors: Takeshi Kubota, Mitsuhiro Bekku, Osamu Takayama, Miho Nagasawa
  • Patent number: 7907767
    Abstract: The invention is intended to obtain optimal shim values even if slice planes are slanted with respect to the system-inherent coordinate system. The section for setting a plane for calculating shim values sets planes perpendicular to and a plane parallel with a slice plane in a system of coordinates x?, y?, and z? perpendicular to the slice plane. The section for calculating shim values obtains shim values with regard to this slice plane in this coordinate system, based on data acquired by the data acquiring section. The coordinates converting section converts the thus obtained shim values to shim values in the system-inherent x-y-z coordinate system of the MRI apparatus.
    Type: Grant
    Filed: June 4, 2007
    Date of Patent: March 15, 2011
    Assignee: GE Medical Systems Global Technology Company, LLC
    Inventors: Mitsuhiro Bekku, Naotaka Adachi
  • Publication number: 20070280524
    Abstract: The invention is intended to obtain optimal shim values even if slice planes are slanted with respect to the system-inherent coordinate system. The section for setting a plane for calculating shim values sets planes perpendicular to and a plane parallel with a slice plane in a system of coordinates x?, y?, and z? perpendicular to the slice plane. The section for calculating shim values obtains shim values with regard to this slice plane in this coordinate system, based on data acquired by the data acquiring section. The coordinates converting section converts the thus obtained shim values to shim values in the system-inherent x-y-z coordinate system of the MRI apparatus.
    Type: Application
    Filed: June 4, 2007
    Publication date: December 6, 2007
    Inventors: Mitsuhiro Bekku, Naotaka Adachi