Patents by Inventor Mitsuhiro Enokida

Mitsuhiro Enokida has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Semiconductor test data analysis system
    Patent number: 7035752
    Abstract: A semiconductor test data analysis system (1) automatically recording, during an analysis operation, operation information of the analysis operation, including analysis conditions or an analysis procedure for input test data, or analysis information obtained by the analysis operation. The analysis system includes a processing means (101), an analysis target data storage means (109), which stores the test data as analysis target data, a historical data storage means (107), which stores as historical data either operation information of the analysis operation or analysis information obtained by the analysis operation, and a display data storage means (112), which stores analysis information obtained by the analysis operation, which stores analysis display data generated by the processing means for the purpose of displaying the analysis information obtained by the analysis operation.
    Type: Grant
    Filed: January 4, 2005
    Date of Patent: April 25, 2006
    Assignee: Agilent Technologies, Inc.
    Inventors: Yasuhiko Iguchi, Hiroshi Tamura, Mitsuhiro Enokida, Earl Louis Dombroski, Thomas Robert Claus
  • Semiconductor test data analysis system
    Publication number: 20050119852
    Abstract: A semiconductor test data analysis system (1) automatically recording, during an analysis operation, operation information of the analysis operation, including analysis conditions or an analysis procedure for input test data, or analysis information obtained by the analysis operation. The analysis system includes a processing means (101), an analysis target data storage means (109), which stores the test data as analysis target data, a historical data storage means (107), which stores as historical data either operation information of the analysis operation or analysis information obtained by the analysis operation, and a display data storage means (112), which stores analysis information obtained by the analysis operation, which stores analysis display data generated by the processing means for the purpose of displaying the analysis information obtained by the analysis operation.
    Type: Application
    Filed: January 4, 2005
    Publication date: June 2, 2005
    Inventors: Yasuhiko Iguchi, Hiroshi Tamura, Mitsuhiro Enokida, Earl Dombroski, Thomas Claus
  • Semiconductor test data analysis system
    Patent number: 6898545
    Abstract: A semiconductor test data analysis system (1) automatically recording, during an analysis operation, operation information of the analysis operation, including analysis conditions or an analysis procedure for input test data, or analysis information obtained by the analysis operation. The analysis system includes a processing means (101), an analysis target data storage means (109), which stores the test data as analysis target data, a historical data storage means (107), which stores as historical data either operation information of the analysis operation or analysis information obtained by the analysis operation, and a display data storage means (112), which stores analysis information obtained by the analysis operation, which stores analysis display data generated by the processing means for the purpose of displaying the analysis information obtained by the analysis operation.
    Type: Grant
    Filed: June 28, 2002
    Date of Patent: May 24, 2005
    Assignees: Agilent Technologies Inc, Sandia Technologies, Inc
    Inventors: Yasuhiko Iguchi, Hiroshi Tamura, Mitsuhiro Enokida, Earl Louis Dombroski, Thomas Robert Claus
  • Data analysis apparatus
    Publication number: 20040001096
    Abstract: A data analysis apparatus having a graph display device that displays a graph of data that are the subject of display, a map display device pertaining to the test position of data that are the subject of display, and a graph element selection device, with which the desired graphed data on the graph display device are selected and the mapped data on the map display device relating to the data that have been selected are displayed in highlighted form, or a data analysis apparatus further comprising a map element selection device, with which the desired data on the map display device are selected and graphed data on the graph display device related to the mapped data that have been selected are displayed in highlighted form.
    Type: Application
    Filed: June 19, 2003
    Publication date: January 1, 2004
    Inventors: Hiroshi Tamura, Yasuhiko Iguchi, Mitsuhiro Enokida