Patents by Inventor Mitsuhiro Gono

Mitsuhiro Gono has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 9173556
    Abstract: An eye measurement apparatus includes: a subjective measurement optical system configured to subjectively measure an examinee's eye, the subjective measurement optical system including: a chart to be presented to the examinee's eye; and a glare light source for irradiating the examinee's eye with a glare light; and a control part configured to determine presence or absence of opacity in a light transmitting part of the examinee's eye and, when the presence of opacity is determined, to allow display of necessity for a glare test which is a subjective measurement to be performed in a state that the examinee's eye is irradiated with the glare light.
    Type: Grant
    Filed: December 22, 2011
    Date of Patent: November 3, 2015
    Assignee: NIDEK CO., LTD.
    Inventors: Kenji Nakamura, Mitsuhiro Gono
  • Patent number: 8696125
    Abstract: An eye refractive power measurement apparatus includes: a measuring optical system for projecting measurement light onto a fundus of an examinee's eye, and causing a two-dimensional imaging device to capture the measurement light to be reflected from the fundus as a plurality of target pattern images at different distances from a measurement optical axis; a light deflecting member arranged at a position out of a conjugate position with a pupil of the examinee's eye on an optical path of the measuring optical system; a rotor for rotating the light deflecting member about an optical axis of the measuring optical system to allow a plurality of pattern light beams to be eccentrically rotated on the pupil; and a calculator for measuring an eye refractive power of the examinee's eye based on a target pattern image to be captured by the two-dimensional imaging device.
    Type: Grant
    Filed: September 29, 2011
    Date of Patent: April 15, 2014
    Assignee: Nidek Co., Ltd.
    Inventors: Koji Hamaguchi, Mitsuhiro Gono, Masaaki Hanebuchi, Hisashi Ochi
  • Publication number: 20120162606
    Abstract: An eye measurement apparatus includes: a subjective measurement optical system configured to subjectively measure an examinee's eye, the subjective measurement optical system including: a chart to be presented to the examinee's eye; and a glare light source for irradiating the examinee's eye with a glare light; and a control part configured to determine presence or absence of opacity in a light transmitting part of the examinee's eye and, when the presence of opacity is determined, to allow display of necessity for a glare test which is a subjective measurement to be performed in a state that the examinee's eye is irradiated with the glare light.
    Type: Application
    Filed: December 22, 2011
    Publication date: June 28, 2012
    Applicant: NIDEK CO., LTD.
    Inventors: Kenji NAKAMURA, Mitsuhiro GONO
  • Publication number: 20120019778
    Abstract: An eye refractive power measurement apparatus includes: a measuring optical system for projecting measurement light onto a fundus of an examinee's eye, and causing a two-dimensional imaging device to capture the measurement light to be reflected from the fundus as a plurality of target pattern images at different distances from a measurement optical axis; a light deflecting member arranged at a position out of a conjugate position with a pupil of the examinee's eye on an optical path of the measuring optical system; a rotor for rotating the light deflecting member about an optical axis of the measuring optical system to allow a plurality of pattern light beams to be eccentrically rotated on the pupil; and a calculator for measuring an eye refractive power of the examinee's eye based on a target pattern image to be captured by the two-dimensional imaging device.
    Type: Application
    Filed: September 29, 2011
    Publication date: January 26, 2012
    Applicant: NIDEK CO., LTD.
    Inventors: Koji HAMAGUCHI, Mitsuhiro GONO, Masaaki HANEBUCHI, Hisashi OCHI
  • Patent number: 8079708
    Abstract: An eye refractive power measurement apparatus measures both eye refractive powers in cases where a pupil is small and large in diameter with ease. This apparatus includes: a measuring optical system causing an imaging device to capture a ring-shaped image based on measurement light reflected from a fundus of an examinee's eye; a light deflecting member arranged at a position, which is not conjugated with a pupil of the examinee's eye, on an optical path of the measuring optical system; a rotor causing the light deflecting member to rotate about an optical axis of the measuring optical system; and an eccentricity amount changer changing an amount of eccentricity of the measurement light, which is rotated eccentrically on a surface of the pupil, with respect to a center of the pupil, in order to change a region, where the measurement light passes, on the surface of the pupil.
    Type: Grant
    Filed: September 24, 2010
    Date of Patent: December 20, 2011
    Assignee: Nidek Co., Ltd.
    Inventors: Koji Hamaguchi, Mitsuhiro Gono
  • Publication number: 20110075097
    Abstract: An eye refractive power measurement apparatus measures both eye refractive powers in cases where a pupil is small and large in diameter with ease. This apparatus includes: a measuring optical system causing an imaging device to capture a ring-shaped image based on measurement light reflected from a fundus of an examinee's eye; a light deflecting member arranged at a position, which is not conjugated with a pupil of the examinee's eye, on an optical path of the measuring optical system; a rotor causing the light deflecting member to rotate about an optical axis of the measuring optical system; and an eccentricity amount changer changing an amount of eccentricity of the measurement light, which is rotated eccentrically on a surface of the pupil, with respect to a center of the pupil, in order to change a region, where the measurement light passes, on the surface of the pupil.
    Type: Application
    Filed: September 24, 2010
    Publication date: March 31, 2011
    Applicant: NIDEK CO., LTD.
    Inventors: Koji HAMAGUCHI, Mitsuhiro GONO
  • Patent number: 7824032
    Abstract: An eye refractive power measurement apparatus for objectively measuring eye refractive power of a patient's eye, includes: a light-projecting optical system that includes a light source and projects measurement light onto a fundus of the patient's eye; a light-receiving optical system that includes an imager device serving as a two-dimensional light-receiving element and receives the measurement light reflected from the fundus; and an operating section that determines the eye refractive power of the eye based on a two-dimensional pattern image by the measurement light imaged by the imager device. The light source is a super-luminescent diode or a laser diode that emits light having a center wavelength in a range of approximately 850 nm to 940 nm.
    Type: Grant
    Filed: January 6, 2006
    Date of Patent: November 2, 2010
    Assignee: Nidek Co., Ltd.
    Inventors: Naoki Isogai, Masaaki Hanebuchi, Mitsuhiro Gono, Kenji Nakamura
  • Publication number: 20090185136
    Abstract: An eye refractive power measurement apparatus for objectively measuring eye refractive power of a patient's eye, includes: a light-projecting optical system that includes a light source and projects measurement light onto a fundus of the patient's eye; a light-receiving optical system that includes an imager device serving as a two-dimensional light-receiving element and receives the measurement light reflected from the fundus; and an operating section that determines the eye refractive power of the eye based on a two-dimensional pattern image by the measurement light imaged by the imager device. The light source is a super-luminescent diode or a laser diode that emits light having a center wavelength in a range of approximately 850 nm to 940 nm.
    Type: Application
    Filed: January 6, 2006
    Publication date: July 23, 2009
    Applicant: NIDEK CO., LTD.
    Inventors: Naoki Isogai, Masaaki Hanebuchi, Mitsuhiro Gono, Kenji Nakamura
  • Patent number: 7416301
    Abstract: An eye refractive power measurement apparatus capable of measuring even an eye with a small pupil diameter with accuracy and stability. The apparatus has a measurement optical system including a projection optical system, having a light source, for projecting spot-shaped measurement light onto a fundus and a photo-receiving optical system, having a photodetector, for photo-receiving the measurement light reflected from the fundus via a peripheral pupillary portion, a calculation part which obtains the eye reflective power based on an output from the photodetector, alight deflection member, an arrangement of which in the measurement optical system being prevented from having a positional relationship optically approximately conjugate with a pupil, and a rotation unit which rotates the light deflection member about a measurement optical axis of the measurement optical system.
    Type: Grant
    Filed: December 17, 2004
    Date of Patent: August 26, 2008
    Assignee: Nidek Co., Ltd.
    Inventors: Masaaki Hanebuchi, Mitsuhiro Gono
  • Patent number: 7316480
    Abstract: An eye refractive power measurement apparatus which is capable of measuring even an eye with a small pupil diameter and measuring a normal eye with a large enough pupil diameter with accuracy and stability. The apparatus includes a measurement optical system for photo-receiving measurement light from a fundus via a ring-shaped aperture arranged at an approximately conjugate position with a pupil by using a photodetector, a changing device for changing a size of the ring-shaped aperture on a pupillary surface to a size different in both inside diameter and outside diameter, and a calculation device for calculating the eye refractive power based on a photo-receiving result obtained by the photodetector.
    Type: Grant
    Filed: September 27, 2004
    Date of Patent: January 8, 2008
    Assignee: Nidek Co., Ltd.
    Inventors: Masaaki Hanebuchi, Mitsuhiro Gono, Mikio Kurachi, Naoki Isogai
  • Publication number: 20050157261
    Abstract: An eye refractive power measurement apparatus capable of measuring even an eye with a small pupil diameter with accuracy and stability. The apparatus has a measurement optical system including a projection optical system, having a light source, for projecting spot-shaped measurement light onto a fundus and a photo-receiving optical system, having a photodetector, for photo-receiving the measurement light reflected from the fundus via a peripheral pupillary portion, a calculation part which obtains the eye reflective power based on an output from the photodetector, alight deflection member, an arrangement of which in the measurement optical system being prevented from having a positional relationship optically approximately conjugate with a pupil, and a rotation unit which rotates the light deflection member about a measurement optical axis of the measurement optical system.
    Type: Application
    Filed: December 17, 2004
    Publication date: July 21, 2005
    Applicant: NIDEK CO., LTD.
    Inventors: Masaaki Hanebuchi, Mitsuhiro Gono
  • Publication number: 20050068497
    Abstract: An eye refractive power measurement apparatus which is capable of measuring even an eye with a small pupil diameter and measuring a normal eye with a large enough pupil diameter with accuracy and stability. The apparatus includes a measurement optical system for photo-receiving measurement light from a fundus via a ring-shaped aperture arranged at an approximately conjugate position with a pupil by using a photodetector, a changing device for changing a size of the ring-shaped aperture on a pupillary surface to a size different in both inside diameter and outside diameter, and a calculation device for calculating the eye refractive power based on a photo-receiving result obtained by the photodetector.
    Type: Application
    Filed: September 27, 2004
    Publication date: March 31, 2005
    Applicant: NIDEK CO., LTD.
    Inventors: Masaaki Hanebuchi, Mitsuhiro Gono, Mikio Kurachi, Naoki Isogai
  • Patent number: 5909268
    Abstract: An alignment detecting apparatus for detecting an alignment condition between an eye to be examined having approximately spherical surface or approximately toric surface and a device having a standard axial lines the apparatus comprising a target projecting optical system which includes a first target projecting optical system for projecting a first target with a predetermined angle relative to the standard axial line, and a second target projecting optical system for projecting a second target with a different angle compared with the angle of the first target projecting optical system relative to the standard axial lines of which at least one between the first and second targets is a target of a finite distances a detecting optical system for detecting positions of images of the first and second targets which are projected onto the eye by the first and second target projecting optical systems, and a judging device for judging the alignment condition based on results detected by the detecting optical system.
    Type: Grant
    Filed: October 27, 1997
    Date of Patent: June 1, 1999
    Assignee: Nidek Co., Ltd.
    Inventors: Naoki Isogai, Koki Kato, Nobuharu Kobayashi, Mitsuhiro Gono, Noriyuki Ishihara