Patents by Inventor Mitsuhiro Iga

Mitsuhiro Iga has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11435295
    Abstract: A sensor element is used to collect environment information on a surface of the earth or a surface layer of the earth by being scattered in a target region where the environment information is collected. At least one of reflection properties, transmission properties, absorption properties, or luminescence properties with respective to an electromagnetic wave with a specific wavelength, or light emitting properties changes in accordance with an environment.
    Type: Grant
    Filed: August 29, 2019
    Date of Patent: September 6, 2022
    Assignee: Yokogawa Electric Corporation
    Inventors: Koichi Taniguchi, Mitsuhiro Iga
  • Patent number: 11429104
    Abstract: An environment information collecting system collects environment information on a surface of the earth or a surface layer of the earth. The environment information collecting system includes a sensor element which is scattered in a target region where the environment information is collected, of which at least one of reflection properties, transmission properties, absorption properties, or luminescence properties with respective to an electromagnetic wave with a specific wavelength, or light emitting properties changes in accordance with an environment, and an aircraft configured to receive the electromagnetic wave obtained from the sensor element and configured to collect the environment information in the target region.
    Type: Grant
    Filed: August 27, 2019
    Date of Patent: August 30, 2022
    Assignee: Yokogawa Electric Corporation
    Inventors: Koichi Taniguchi, Mitsuhiro Iga
  • Publication number: 20200072757
    Abstract: A sensor element is used to collect environment information on a surface of the earth or a surface layer of the earth by being scattered in a target region where the environment information is collected. At least one of reflection properties, transmission properties, absorption properties, or luminescence properties with respective to an electromagnetic wave with a specific wavelength, or light emitting properties changes in accordance with an environment.
    Type: Application
    Filed: August 29, 2019
    Publication date: March 5, 2020
    Inventors: Koichi TANIGUCHI, Mitsuhiro IGA
  • Publication number: 20200073390
    Abstract: An environment information collecting system collects environment information on a surface of the earth or a surface layer of the earth. The environment information collecting system includes a sensor element which is scattered in a target region where the environment information is collected, of which at least one of reflection properties, transmission properties, absorption properties, or luminescence properties with respective to an electromagnetic wave with a specific wavelength, or light emitting properties changes in accordance with an environment, and an aircraft configured to receive the electromagnetic wave obtained from the sensor element and configured to collect the environment information in the target region.
    Type: Application
    Filed: August 27, 2019
    Publication date: March 5, 2020
    Inventors: Koichi TANIGUCHI, Mitsuhiro IGA
  • Patent number: 9442013
    Abstract: A microscope spectrometer in which, when an excitation light from a light source illuminates a sample, a light emitted from the sample that enters a microscope is analyzed, may include: a first optical means that forms the light emitted from the sample as a parallel beam; a first variable bandpass filter means having a variable wavelength passband that transmits incident light, which of the parallel beam of incident light, is light of a pre-established wavelength passband; a two-dimensional array light detection means that images the light in the wavelength passband; and a control means that controls the timing of the imaging by the two-dimensional array light detection means and, in accordance with the timing, changes the wavelength passband of the first variable bandpass filter means.
    Type: Grant
    Filed: May 20, 2013
    Date of Patent: September 13, 2016
    Assignee: YOKOGAWA ELECTRIC CORPORATION
    Inventor: Mitsuhiro Iga
  • Publication number: 20140125981
    Abstract: A spectroscopic apparatus includes an optical system configured to transmit output light from a sample irradiated with irradiation light from a light source, a two-dimensional array light detector configured to photograph light transmitted through the optical system, and a control unit. The optical system includes a first optical device disposed between the sample and the two-dimensional array light detector, a second optical device disposed between the two-dimensional array light detector and the first optical device, and a variable band-pass filter disposed in at least one of spaces between the first optical device and the sample and between the second optical device and the two-dimensional array light detector. The control unit changes a light transmission wavelength band of the variable band-pass filter in accordance with a photographing timing of the two-dimensional array light detector.
    Type: Application
    Filed: November 6, 2013
    Publication date: May 8, 2014
    Applicant: YOKOGAWA ELECTRIC CORPORATION
    Inventors: Mitsuhiro IGA, Takeo TANAAMI, Nobuyuki KAKURYU
  • Publication number: 20130258332
    Abstract: A microscope spectrometer in which, when an excitation light from a light source illuminates a sample, a light emitted from the sample that enters a microscope is analyzed, may include: a first optical means that forms the light emitted from the sample as a parallel beam; a first variable bandpass filter means having a variable wavelength passband that transmits incident light, which of the parallel beam of incident light, is light of a pre-established wavelength passband; a two-dimensional array light detection means that images the light in the wavelength passband; and a control means that controls the timing of the imaging by the two-dimensional array light detection means and, in accordance with the timing, changes the wavelength passband of the first variable bandpass filter means.
    Type: Application
    Filed: May 20, 2013
    Publication date: October 3, 2013
    Applicant: YOKOGAWA ELECTRIC CORPORATION
    Inventor: Mitsuhiro Iga
  • Patent number: 7389009
    Abstract: An optical fiber sensor enabling simpler detection of a state of an external environment and a measuring apparatus using the same are provided. At a front end of an optical fiber portion 20a for transmitting the light a hetero core having a different diameter from that of a core of the optical fiber portion 20a is melt bonded so as to form a tip type optical fiber sensor 9 having a sensor portion 4 comprised of the hetero core on its front end. An end of the optical fiber portion 20a side of this tip type optical fiber sensor 9 has a light source 1 connected to it. Returned light striking the optical fiber portion 20a from the light source 1 and subjected to interaction with a measurement medium MD at the sensor portion 4 is split by an optical fiber coupler 2 and received at a photodiode or spectrum analyzer 6, thereby an optical fiber sensor measuring apparatus 100 is constructed.
    Type: Grant
    Filed: October 15, 2004
    Date of Patent: June 17, 2008
    Assignee: Tama- Tlo, Ltd.
    Inventors: Mitsuhiro Iga, Kazuhiro Watanabe, Atsushi Seki
  • Publication number: 20070077000
    Abstract: An optical fiber sensor enabling simpler detection of a state of an external environment and a measuring apparatus using the same are provided. At a front end of an optical fiber portion 20a for transmitting the light a hetero core having a different diameter from that of a core of the optical fiber portion 20a is melt bonded so as to form a tip type optical fiber sensor 9 having a sensor portion 4 comprised of the hetero core on its front end. An end of the optical fiber portion 20a side of this tip type optical fiber sensor 9 has a light source 1 connected to it. Returned light striking the optical fiber portion 20a from the light source 1 and subjected to interaction with a measurement medium MD at the sensor portion 4 is split by an optical fiber coupler 2 and received at a photodiode or spectrum analyzer 6, thereby an optical fiber sensor measuring apparatus 100 is constructed.
    Type: Application
    Filed: October 15, 2004
    Publication date: April 5, 2007
    Inventors: Mitsuhiro Iga, Kazuhiro Watanabe, Seki Atsushi