Abstract: A discharge lamp includes a discharge tube containing electrodes, and base sections. The base sections have terminals for connecting to external power lines, and internal power lines for connecting the terminals to the electrodes within the discharge tube. Information generation devices that generates information to be output to outside are provided within the base sections. Superimposition circuits that superpose the information, generated by the information generation devices, on the internal power lines within the base sections are also provided within the base sections. The information generation devices include sensors and generate information based on output of the sensors. A receiving circuit extracts and receives the information, superposed on the internal power lines, from the external power lines connected to the internal power lines. Thus, information generated on the discharge lamp side can be transmitted to outside with a simple construction.

Abstract: A discharge lamp includes a discharge tube containing electrodes, and base sections. The base sections have terminals for connecting to external power lines, and internal power lines for connecting the terminals to the electrodes within the discharge tube. Information generation devices that generates information to be output to outside are provided within the base sections. Superimposition circuits that superpose the information, generated by the information generation devices, on the internal power lines within the base sections are also provided within the base sections. The information generation devices include sensors and generate information based on output of the sensors. A receiving circuit extracts and receives the information, superposed on the internal power lines, from the external power lines connected to the internal power lines. Thus, information generated on the discharge lamp side can be transmitted to outside with a simple construction.

Abstract: Disclosed are a plant growth lighting apparatus capable of forming a lighting region having a high degree of illuminance uniformity in the array direction of a light-emitting element array as well as a plant hydroponic cultivation apparatus and a plant hydroponic cultivation method capable of growing a plant with high growth efficiency even in a large cultivation region. A plurality of light-emitting element units, each including a first light-emitting element and a second light-emitting element having an emission peak wavelength different from that of the first light-emitting element, are arranged side by side along one direction to form a light-emitting element array. The light-emitting element unit is constituted by two second light-emitting elements disposed so as to be spaced apart from each other in the one direction and one first light-emitting element disposed between the two second light-emitting elements.

Abstract: A lighting circuit according to embodiments includes: a self-hold element connected in series to an AC power source that generates power for lighting an illumination load, together with the illumination load, the self-hold element being configured to control supply of the power provided by the AC power source to the illumination load by the self-hold element being turned on/off; a noise prevention circuit connected in parallel to the self-hold element; and a damping circuit configured to connect a damping resistance to the noise prevention circuit parallely only for a predetermined period from turning-on of the self-hold element, thereby preventing the self-hold element from being repeatedly turned on/off during a period in which the self-hold element is on under normal conditions, due to a transient during power supply.

Abstract: A measurement unit for tensile or compressive stress can includes a CCD camera for detecting an interference light, the interference light being formed with a measurement beam from a measured region and a reference beam from a reference mirror. A first objective lens can have the reference mirror. An image processing apparatus can measure the three-dimensional shape of the measured region from the position of the first objective lens at which the interference light provides the maximum contrast and can measure the distance between two gauge points on the basis of the three-dimensional shape. When strain is generated on a micromaterial, the strain against the measured tensile stress is measured on the basis of the tensile stress and the distance between the two gauge points.

Abstract: A lighting circuit according to embodiments includes: a self-hold element connected in series to an AC power source that generates power for lighting an illumination load, together with the illumination load, the self-hold element being configured to control supply of the power provided by the AC power source to the illumination load by the self-hold element being turned on/off; a noise prevention circuit connected in parallel to the self-hold element; and a damping circuit configured to connect a damping resistance to the noise prevention circuit parallely only for a predetermined period from turning-on of the self-hold element, thereby preventing the self-hold element from being repeatedly turned on/off during a period in which the self-hold element is on under normal conditions, due to a transient during power supply.

Abstract: A measurement unit for tensile or compressive stress can includes a CCD camera for detecting an interference light, the interference light being formed with a measurement beam from a measured region and a reference beam from a reference mirror. A first objective lens can have the reference mirror. An image processing apparatus can measure the three-dimensional shape of the measured region from the position of the first objective lens at which the interference light provides the maximum contrast and can measure the distance between two gauge points on the basis of the three-dimensional shape. When strain is generated on a micromaterial, the strain against the measured tensile stress is measured on the basis of the tensile stress and the distance between the two gauge points.

Abstract: There is provided a substrate processing system that can automatically inspect the operation of various kinds of parts of a semiconductor manufacturing apparatus without increasing the load of a main controller in the semiconductor manufacturing apparatus. In the substrate processing system of the present invention, inspection data of the semiconductor manufacturing apparatus 1 under operation are shared and collected online by a main controller 5, a data collection auxiliary computer 2 and a data collecting computer 3 through a network 6, and the operation state is collectively inspected by an inspecting computer 4.

Abstract: Disclosed is a direct current power switch device which safely shuts off direct current power supply without generating arc at the time of shutting off the power supply to an electrical load. The direct current power switch device is provided with: an operation input unit (12), which instructs supply and supply stop of direct current power; a switch contact (14) provided on a power feed line, which supplies the direct current power to a lighting controller (30), i.e., an electrical apparatus that controls power supply; a notifying means, which notifies the lighting controller (30) of power shutoff, in the case where the operation input unit (12) instructed supply stop of the direct current power; and a control unit (11) which opens the switch contact (14) when it is detected that power supply has been controlled to reduce the current in the electrical apparatus after the notification is made.

Abstract: A lighting circuit according to embodiments includes: a self-hold element connected in series to an AC power source that generates power for lighting an illumination load, together with the illumination load, the self-hold element being configured to control supply of the power provided by the AC power source to the illumination load by the self-hold element being turned on/off; a noise prevention circuit connected in parallel to the self-hold element; and a damping circuit configured to connect a damping resistance to the noise prevention circuit parallely only for a predetermined period from turning-on of the self-hold element, thereby preventing the self-hold element from being repeatedly turned on/off during a period in which the self-hold element is on under normal conditions, due to a transient during power supply.

Abstract: There is provided a substrate processing system that can automatically inspect the operation of various kinds of parts of a semiconductor manufacturing apparatus without increasing the load of a main controller in the semiconductor manufacturing apparatus. In the substrate processing system of the present invention, inspection data of the semiconductor manufacturing apparatus 1 under operation are shared and collected online by a main controller 5, a data collection auxiliary computer 2 and a data collecting computer 3 through a network 6, and the operation state is collectively inspected by an inspecting computer 4.

Abstract: The present invention is one for providing an apparatus and a method which make it possible to remove a foreign object or matter such as scale attached on an inner surface of a pipe easily for a short period of time by means of simple equipment and manner, and constituted as follows. Specifically, a holder (11) is attached onto an end of a pipe (P), an abrasion assisting member (16) fixed to a tip end of a support arm (15) is inserted into the pipe (P) by use of the holder (11) and stopped at an area (A) where oxide scale (S) is generated in a large amount. Then abrasive is sent with pressure into the pipe (P) by a blast device (14), and thus a flow rate of the abrasive in the scale-abraded area (A) is increased to abrade and remove the oxide scale (S) securely. Moreover, if required, a spiral groove (17) is formed on an outer circumference of the abrasion assisting member (16) to increase centrifugal force of the abrasive.

Abstract: The present invention is one for providing an apparatus and a method which make it possible to remove a foreign object or matter such as scale attached on an inner surface of a pipe easily for a short period of time by means of simple equipment and manner, and constituted as follows. Specifically, a holder (11) is attached onto an end of a pipe (P), an abrasion assisting member (16) fixed to a tip end of a support arm (15) is inserted into the pipe (P) by use of the holder (11) and stopped at an area (A) where oxide scale (S) is generated in a large amount. Then abrasive is sent with pressure into the pipe (P) by a blast device (14), and thus a flow rate of the abrasive in the scale-abraded area (A) is increased to abrade and remove the oxide scale (S) securely. Moreover, if required, a spiral groove (17) is formed on an outer circumference of the abrasion assisting member (16) to increase centrifugal force of the abrasive.

Abstract: Each of a plurality of standard sentences is beforehand prepared in a plurality of languages and managed as a database in which they are made to correspond to each other. A standard sentence specified by the user from among the plurality of sentences is displayed, so that in response to a translation instruction for translation into a language specified by the user from among the plurality of languages, a standard sentence written in the specified language which corresponds the above-mentioned specified standard sentence is retrieved in the database and then displayed at the terminal.

Abstract: This invention suppresses the occurrence of interference in a very short period to prevent device destruction. An inverter circuit of this invention includes a crystal oscillator, which oscillates at a fixed frequency, a load-status detector, which receives a voltage and current to be applied to a load including an inductive or capacitive component and detects the status of the load, a voltage-controlled oscillator, which oscillates at a frequency corresponding to the load status detected by the load-status detector, and a switch, which selects the output of the crystal oscillator or the output of the voltage-controlled oscillator and supplies the selected output to the load. An electrodeless discharge lamp lighting device according to this invention uses an inverter circuit having the above structure.

Abstract: A photopolymerizable coating composition comprising:(A) 100 parts by weight of a vehicle consisting essentially of a urethaneacrylate oligomer;(B) from 0.1 to 5 parts by weight of an acylphosphine oxide compound as a photoinitiator;(C) from 1 to 100 parts by weight of a color pigment; and(D) from 20 to 300 parts by weight of a transparent glass powder having an average particle size of not larger than 100 .mu.m and an index of refraction which does not differ more than 0.3 from the index of refraction of the composition excluding the color pigment.

Abstract: A thermosetting synthetic polymer dispersion obtained by copolymerizing unsaturated monomers in a non-polar organic liquid or an organic liquid having a low polarity in the presence of a stabilizer formed by reacting (1) a partially blocked isocyanate containing a free isocyanate group and a blocked isocyanate group with (2) an active hydrogen-containing, polymer compound in such a ratio that the amount of the active hydrogen group of the compound (2) is at least equivalent to the amount of the free isocyanate group of the isocyanate compound (1), and a process for the preparation of such a thermosetting synthetic polymer dispersion.