Abstract: A molecular detection apparatus according to an embodiment includes: a collection unit collecting a detection target gas containing a molecule to be detected; a substitution unit substituting a part of a molecular structure of at least a part of the molecule to generate a substitution product; a detector including a plurality of detection cells each having a sensor unit and an organic probe disposed at the sensor unit, the organic probe capturing the molecule or the substitution product; and a discriminator discriminating the molecule by a signal pattern based on an intensity difference of detection signals generated with the molecule or the substitution product being captured by the organic probes of the plurality of detection cells.

Abstract: A gas detection apparatus according to an embodiment includes: a collection unit collecting a detection target gas containing a gas molecule to be detected; a detector including a plurality of detection cells each including a sensor unit and an organic probe disposed at the sensor unit, the organic probe capturing the gas molecule collected by the collection unit; a discriminator discriminating the gas molecule by a signal pattern based on an intensity difference of detection signals generated with the gas molecule being captured by the organic probes of the plurality of detection cells; and a reactivation unit applying heat to the organic probe which has the captured gas molecule to be desorbed the gas molecule from the organic probe.

Abstract: This invention relates to a method of quantitative analysis of hexavalent chromium in a chromate coating on a substrate. In this method a substrate on which the chromate coating is formed is immersed into an aqueous solution containing lithium hydroxide to extract hexavalent chromium within an extraction solution. Quantitative analysis of extracted hexavalent chromium in the extraction solution is then performed.

Abstract: An electrode material for nonaqueous electrolyte secondary battery of an embodiment includes a silicon nanoparticle, and a coating layer coating the silicon nanoparticle. The coating layer includes an amorphous silicon oxide and a silicon carbide phase. At least a part of the silicon carbide phase exists on a surface of the silicon nanoparticle.

Abstract: The present invention relates to a joint (10) that includes a first member (11) to be jointed, a second member (12) to be jointed and a jointing layer (13) located between the first member (11) and the second member (12). The jointing layer (13) is made of Sn metal and a metallic material with a melting point higher than the melting point of the Sn metal. The present invention relates also to a method of joining this first member (11) to the second member (12).

Abstract: One embodiment of method for extracting hexavalent chromium includes preparing a liquid sample by adding a fatty acid to a polymer material, adding water or an aqueous alkali solution to this sample, and extracting hexavalent chromium contained in the sample in the water or the aqueous alkali solution.

Abstract: The present invention relates to a joint (10) that includes a first member (11) to be jointed, a second member (12) to be jointed and a jointing layer (13) located between the first member (11) and the second member (12). The jointing layer (13) is made of Sn metal and a metallic material with a melting point higher than the melting point of the Sn metal. The present invention relates also to a method of joining this first member (11) to the second member (12).

Abstract: A method for controlling a hazardous element in an encapsulating resin of a resin encapsulation semiconductor device includes subjecting the device to qualitative analysis with a fluorescent X-ray analyzer to judge whether the hazardous element is contained in the encapsulating resin, aligning a plurality of devices with each of upper and lower surfaces of the devices brought into a plane, setting the surfaces of the devices to cover a full X-ray irradiation plane and subjecting the devices to quantitative analysis with the fluorescent X-ray analyzer to obtain an analytical value of the hazardous element in the encapsulating resin for upper and lower surfaces of the devices, and judging whether the analytical value of the hazardous element which is less influenced by a coexistent element of the analytical values for the upper and lower surfaces of the devices exceeds a threshold value.

Abstract: A method for controlling a hazardous element in an encapsulating resin of a resin encapsulation semiconductor device includes subjecting the device to qualitative analysis with a fluorescent X-ray analyzer to judge whether the hazardous element is contained in the encapsulating resin, aligning a plurality of devices with each of upper and lower surfaces of the devices brought into a plane, setting the surfaces of the devices to cover a full X-ray irradiation plane and subjecting the devices to quantitative analysis with the fluorescent X-ray analyzer to obtain an analytical value of the hazardous element in the encapsulating resin for upper and lower surfaces of the devices, and judging whether the analytical value of the hazardous element which is less influenced by a coexistent element of the analytical values for the upper and lower surfaces of the devices exceeds a threshold value.

Abstract: One embodiment of method for extracting hexavalent chromium includes preparing a liquid sample by adding a fatty acid to a polymer material, adding water or an aqueous alkali solution to this sample, and extracting hexavalent chromium contained in the sample in the water or the aqueous alkali solution.

Abstract: According to one embodiment, there is provided a method of analyzing antimony contained in glass according to its valency. This method includes milling glass containing antimony into a glass powder, weighing the glass powder and dissolving the glass powder by using hydrofluoric acid and hydrochloric acid to obtain a glass solution, masking hydrofluoric acid by adding aluminum ions to the glass solution, adding sodium borohydride and hydrochloric acid to the glass solution in which hydrofluoric acid is masked to generate a hydride of antimony (III), determining a concentration of antimony (III) contained in the glass solution based on the hydride, determining a total concentration of antimony contained in the glass solution and calculating a difference between the concentration of antimony (III) and the total concentration of antimony to obtain a concentration of antimony (V) from the difference.

Abstract: According to one embodiment, there is provided a method of analyzing antimony contained in glass according to its valency. This method includes milling glass containing antimony into a glass powder, weighing the glass powder and dissolving the glass powder by using hydrofluoric acid and hydrochloric acid to obtain a glass solution, masking hydrofluoric acid by adding aluminum ions to the glass solution, adding sodium borohydride and hydrochloric acid to the glass solution in which hydrofluoric acid is masked to generate a hydride of antimony (III), determining a concentration of antimony (III) contained in the glass solution based on the hydride, determining a total concentration of antimony contained in the glass solution and calculating a difference between the concentration of antimony (III) and the total concentration of antimony to obtain a concentration of antimony (V) from the difference.

Abstract: The present invention relates to a joint (10) that includes a first member (11) to be jointed, a second member (12) to be jointed and a jointing layer (13) located between the first member (11) and the second member (12). The jointing layer (13) is made of Sn metal and a metallic material with a melting point higher than the melting point of the Sn metal. The present invention relates also to a method of joining this first member (11) to the second member (12).

Abstract: A method for controlling a hazardous element in an encapsulating resin of a resin encapsulation semiconductor device includes subjecting the device to qualitative analysis with a fluorescent X-ray analyzer to judge whether the hazardous element is contained in the encapsulating resin, aligning a plurality of devices with each of upper and lower surfaces of the devices brought into a plane, setting the surfaces of the devices to cover a full X-ray irradiation plane and subjecting the devices to quantitative analysis with the fluorescent X-ray analyzer to obtain an analytical value of the hazardous element in the encapsulating resin for upper and lower surfaces of the devices, and judging whether the analytical value of the hazardous element which is less influenced by a coexistent element of the analytical values for the upper and lower surfaces of the devices exceeds a threshold value.

Abstract: A detector for detecting a gaseous component in a gas is comprised of a sensor having a gas detecting region configured to output an electric signal in response to detection of the gaseous component and a contact portion configured to conduct the electric signal; an enclosure housing the sensor and having a through hole configured to introduce the gas to the gas detecting region; a wiring partly facing to the contact portion and being led out of the enclosure; an electric conductor interposed between the contact portion and the wiring; a packing member surrounding the through hole and so as to make a gap between the sensor and the enclosure impervious to the gas.

Abstract: A method of quantitative analysis of hexavalent chromium in a chromate coating includes immersing a substrate on which a chromate coating is formed in an aqueous solution containing lithium hydroxide to extract hexavalent chromium, and performing quantitative analysis of extracted hexavalent chromium.