Patents by Inventor Mitsuhiro Oki

Mitsuhiro Oki has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20170248566
    Abstract: A molecular detection apparatus according to an embodiment includes: a collection unit collecting a detection target gas containing a molecule to be detected; a substitution unit substituting a part of a molecular structure of at least a part of the molecule to generate a substitution product; a detector including a plurality of detection cells each having a sensor unit and an organic probe disposed at the sensor unit, the organic probe capturing the molecule or the substitution product; and a discriminator discriminating the molecule by a signal pattern based on an intensity difference of detection signals generated with the molecule or the substitution product being captured by the organic probes of the plurality of detection cells.
    Type: Application
    Filed: February 28, 2017
    Publication date: August 31, 2017
    Applicant: Kabushiki Kaisha Toshiba
    Inventors: Ko YAMADA, Hirohisa MIYAMOTO, Reiko YOSHIMURA, Norikazu OSADA, Mitsuhiro OKI, Hiroko NAKAMURA
  • Patent number: 9709523
    Abstract: A gas detection apparatus according to an embodiment includes: a collection unit collecting a detection target gas containing a gas molecule to be detected; a detector including a plurality of detection cells each including a sensor unit and an organic probe disposed at the sensor unit, the organic probe capturing the gas molecule collected by the collection unit; a discriminator discriminating the gas molecule by a signal pattern based on an intensity difference of detection signals generated with the gas molecule being captured by the organic probes of the plurality of detection cells; and a reactivation unit applying heat to the organic probe which has the captured gas molecule to be desorbed the gas molecule from the organic probe.
    Type: Grant
    Filed: September 8, 2016
    Date of Patent: July 18, 2017
    Assignee: KABUSHIKI KAISHA TOSHIBA
    Inventors: Norikazu Osada, Hirohisa Miyamoto, Ko Yamada, Hiroko Nakamura, Mitsuhiro Oki
  • Patent number: 9261493
    Abstract: This invention relates to a method of quantitative analysis of hexavalent chromium in a chromate coating on a substrate. In this method a substrate on which the chromate coating is formed is immersed into an aqueous solution containing lithium hydroxide to extract hexavalent chromium within an extraction solution. Quantitative analysis of extracted hexavalent chromium in the extraction solution is then performed.
    Type: Grant
    Filed: June 14, 2012
    Date of Patent: February 16, 2016
    Assignee: KABUSHIKI KAISHA TOSHIBA
    Inventors: Tetsuya Tachibe, Mitsuhiro Oki, Miyuki Takenaka
  • Publication number: 20150086870
    Abstract: An electrode material for nonaqueous electrolyte secondary battery of an embodiment includes a silicon nanoparticle, and a coating layer coating the silicon nanoparticle. The coating layer includes an amorphous silicon oxide and a silicon carbide phase. At least a part of the silicon carbide phase exists on a surface of the silicon nanoparticle.
    Type: Application
    Filed: September 5, 2014
    Publication date: March 26, 2015
    Inventors: Takayuki FUKASAWA, Kenji ESSAKI, Tomokazu MORITA, Takashi KUBOKI, Mitsuhiro OKI, Yasuhiro GOTO
  • Patent number: 8763884
    Abstract: The present invention relates to a joint (10) that includes a first member (11) to be jointed, a second member (12) to be jointed and a jointing layer (13) located between the first member (11) and the second member (12). The jointing layer (13) is made of Sn metal and a metallic material with a melting point higher than the melting point of the Sn metal. The present invention relates also to a method of joining this first member (11) to the second member (12).
    Type: Grant
    Filed: August 6, 2013
    Date of Patent: July 1, 2014
    Assignee: Kabushiki Kaisha Toshiba
    Inventors: Toshihide Takahashi, Tatsuoki Kono, Mitsuhiro Oki, Akiko Suzuki
  • Patent number: 8628600
    Abstract: One embodiment of method for extracting hexavalent chromium includes preparing a liquid sample by adding a fatty acid to a polymer material, adding water or an aqueous alkali solution to this sample, and extracting hexavalent chromium contained in the sample in the water or the aqueous alkali solution.
    Type: Grant
    Filed: January 9, 2012
    Date of Patent: January 14, 2014
    Assignee: Kabushiki Kaisha Toshiba
    Inventors: Miho Muramatsu, Mitsuhiro Oki, Miyuki Takenaka
  • Publication number: 20140008419
    Abstract: The present invention relates to a joint (10) that includes a first member (11) to be jointed, a second member (12) to be jointed and a jointing layer (13) located between the first member (11) and the second member (12). The jointing layer (13) is made of Sn metal and a metallic material with a melting point higher than the melting point of the Sn metal. The present invention relates also to a method of joining this first member (11) to the second member (12).
    Type: Application
    Filed: August 6, 2013
    Publication date: January 9, 2014
    Applicant: KABUSHIKI KAISHA TOSHIBA
    Inventors: Toshihide Takahashi, Tatsuoki Kono, Mitsuhiro Oki, Akiko Suzuki
  • Publication number: 20120264225
    Abstract: A method for controlling a hazardous element in an encapsulating resin of a resin encapsulation semiconductor device includes subjecting the device to qualitative analysis with a fluorescent X-ray analyzer to judge whether the hazardous element is contained in the encapsulating resin, aligning a plurality of devices with each of upper and lower surfaces of the devices brought into a plane, setting the surfaces of the devices to cover a full X-ray irradiation plane and subjecting the devices to quantitative analysis with the fluorescent X-ray analyzer to obtain an analytical value of the hazardous element in the encapsulating resin for upper and lower surfaces of the devices, and judging whether the analytical value of the hazardous element which is less influenced by a coexistent element of the analytical values for the upper and lower surfaces of the devices exceeds a threshold value.
    Type: Application
    Filed: June 14, 2012
    Publication date: October 18, 2012
    Inventors: Mitsuhiro OKI, Miyuki TAKENAKA
  • Patent number: 8223917
    Abstract: A method for controlling a hazardous element in an encapsulating resin of a resin encapsulation semiconductor device includes subjecting the device to qualitative analysis with a fluorescent X-ray analyzer to judge whether the hazardous element is contained in the encapsulating resin, aligning a plurality of devices with each of upper and lower surfaces of the devices brought into a plane, setting the surfaces of the devices to cover a full X-ray irradiation plane and subjecting the devices to quantitative analysis with the fluorescent X-ray analyzer to obtain an analytical value of the hazardous element in the encapsulating resin for upper and lower surfaces of the devices, and judging whether the analytical value of the hazardous element which is less influenced by a coexistent element of the analytical values for the upper and lower surfaces of the devices exceeds a threshold value.
    Type: Grant
    Filed: October 8, 2009
    Date of Patent: July 17, 2012
    Assignee: Kabushiki Kaisha Toshiba
    Inventors: Mitsuhiro Oki, Miyuki Takenaka
  • Publication number: 20120137830
    Abstract: One embodiment of method for extracting hexavalent chromium includes preparing a liquid sample by adding a fatty acid to a polymer material, adding water or an aqueous alkali solution to this sample, and extracting hexavalent chromium contained in the sample in the water or the aqueous alkali solution.
    Type: Application
    Filed: January 9, 2012
    Publication date: June 7, 2012
    Applicant: KABUSHIKI KAISHA TOSHIBA
    Inventors: Miho Muramatsu, Mitsuhiro Oki, Miyuki Takenaka
  • Patent number: 8114672
    Abstract: According to one embodiment, there is provided a method of analyzing antimony contained in glass according to its valency. This method includes milling glass containing antimony into a glass powder, weighing the glass powder and dissolving the glass powder by using hydrofluoric acid and hydrochloric acid to obtain a glass solution, masking hydrofluoric acid by adding aluminum ions to the glass solution, adding sodium borohydride and hydrochloric acid to the glass solution in which hydrofluoric acid is masked to generate a hydride of antimony (III), determining a concentration of antimony (III) contained in the glass solution based on the hydride, determining a total concentration of antimony contained in the glass solution and calculating a difference between the concentration of antimony (III) and the total concentration of antimony to obtain a concentration of antimony (V) from the difference.
    Type: Grant
    Filed: September 23, 2010
    Date of Patent: February 14, 2012
    Assignee: Kabushiki Kaisha Toshiba
    Inventors: Sayaka Morimoto, Miyuki Takenaka, Mitsuhiro Oki
  • Publication number: 20110217782
    Abstract: According to one embodiment, there is provided a method of analyzing antimony contained in glass according to its valency. This method includes milling glass containing antimony into a glass powder, weighing the glass powder and dissolving the glass powder by using hydrofluoric acid and hydrochloric acid to obtain a glass solution, masking hydrofluoric acid by adding aluminum ions to the glass solution, adding sodium borohydride and hydrochloric acid to the glass solution in which hydrofluoric acid is masked to generate a hydride of antimony (III), determining a concentration of antimony (III) contained in the glass solution based on the hydride, determining a total concentration of antimony contained in the glass solution and calculating a difference between the concentration of antimony (III) and the total concentration of antimony to obtain a concentration of antimony (V) from the difference.
    Type: Application
    Filed: September 23, 2010
    Publication date: September 8, 2011
    Applicant: KABUSHIKI KAISHA TOSHIBA
    Inventors: Sayaka Morimoto, Miyuki Takenaka, Mitsuhiro Oki
  • Publication number: 20100247955
    Abstract: The present invention relates to a joint (10) that includes a first member (11) to be jointed, a second member (12) to be jointed and a jointing layer (13) located between the first member (11) and the second member (12). The jointing layer (13) is made of Sn metal and a metallic material with a melting point higher than the melting point of the Sn metal. The present invention relates also to a method of joining this first member (11) to the second member (12).
    Type: Application
    Filed: September 25, 2007
    Publication date: September 30, 2010
    Applicant: KABUSHIKI KAISHA TOSHIBA
    Inventors: Toshihide Takahashi, Tatsuoki Kono, Mitsuhiro Oki, Akiko Suzuki
  • Publication number: 20100091944
    Abstract: A method for controlling a hazardous element in an encapsulating resin of a resin encapsulation semiconductor device includes subjecting the device to qualitative analysis with a fluorescent X-ray analyzer to judge whether the hazardous element is contained in the encapsulating resin, aligning a plurality of devices with each of upper and lower surfaces of the devices brought into a plane, setting the surfaces of the devices to cover a full X-ray irradiation plane and subjecting the devices to quantitative analysis with the fluorescent X-ray analyzer to obtain an analytical value of the hazardous element in the encapsulating resin for upper and lower surfaces of the devices, and judging whether the analytical value of the hazardous element which is less influenced by a coexistent element of the analytical values for the upper and lower surfaces of the devices exceeds a threshold value.
    Type: Application
    Filed: October 8, 2009
    Publication date: April 15, 2010
    Inventors: Mitsuhiro OKI, Miyuki TAKENAKA
  • Publication number: 20080250847
    Abstract: A detector for detecting a gaseous component in a gas is comprised of a sensor having a gas detecting region configured to output an electric signal in response to detection of the gaseous component and a contact portion configured to conduct the electric signal; an enclosure housing the sensor and having a through hole configured to introduce the gas to the gas detecting region; a wiring partly facing to the contact portion and being led out of the enclosure; an electric conductor interposed between the contact portion and the wiring; a packing member surrounding the through hole and so as to make a gap between the sensor and the enclosure impervious to the gas.
    Type: Application
    Filed: April 3, 2008
    Publication date: October 16, 2008
    Applicants: KABUSHIKI KAISHA TOSHIBA, TOSHIBA MATERIALS CO., LTD.
    Inventors: Tomoyuki KITANI, Miyuki Takenaka, Mitsuhiro Oki, Masami Okamura
  • Publication number: 20070048873
    Abstract: A method of quantitative analysis of hexavalent chromium in a chromate coating includes immersing a substrate on which a chromate coating is formed in an aqueous solution containing lithium hydroxide to extract hexavalent chromium, and performing quantitative analysis of extracted hexavalent chromium.
    Type: Application
    Filed: August 29, 2006
    Publication date: March 1, 2007
    Applicant: Kabushiki Kaisha Toshiba
    Inventors: Tetsuya Tachibe, Mitsuhiro Oki, Miyuki Takenaka