Patents by Inventor Mitsuo Fujiwara

Mitsuo Fujiwara has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Ion microanalyzer
    Patent number: 3986025
    Abstract: In an ion microanalyzer wherein the secondary ions emitted from a sample as a result of the bombardment of the sample by a primary ion beam are mass-analyzed and selected in accordance with their mass to electric charge ratios and the selected secondary ions are then detected by a detector, the image of the secondary ions emitted from the sample is formed through the converging action of a modified electrostatic lens on a slit disposed between the mass analyzing means and the detector or in front of the mass analyzing means.
    Type: Grant
    Filed: June 7, 1974
    Date of Patent: October 12, 1976
    Assignee: Hitachi, Ltd.
    Inventors: Mitsuo Fujiwara, Hifumi Tamura, Toshio Kondo