Patents by Inventor Mitsuo Hori
Mitsuo Hori has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 9610656Abstract: A lead-free solder alloy for a vehicle glass according to the present invention contains 26.0 to 56.0 mass % of In, 0.1 to 5.0 mass % of Ag, 0.002 to 0.05 mass % of Ti, 0.001 to 0.01 mass % of Si and the balance being Sn. The lead-free solder alloy may optionally contain 0.005 to 0.1 mass % of Cu and 0.001 to 0.01 mass % of B. This solder alloy can suitably be applied vehicle glasses and show good joint strength to glass materials and high acid resistance, salt water resistance and temperature cycle resistance.Type: GrantFiled: February 27, 2012Date of Patent: April 4, 2017Assignee: Central Glass Company, LimitedInventors: Mizuki Nishi, Takayuki Ogawa, Mitsuo Hori
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Publication number: 20140134387Abstract: Provided is a mat which is capable of significantly contributing to sound and healthy life environment, and particularly capable of effectively reducing energy of electromagnetic waves, vibrations, sounds, impacts, radiations and so on and which has excellent antibacterial properties, antiviral properties, anti-allergen properties and deoderization properties. The mat (11) is a mat with a backing layer (13) formed on the back surface side of a fiber surface layer (12), wherein at least one of the fiber surface layer (12) and the backing layer (13) contains an organic attenuating filler (marked as ?), a radiation reduction filler (marked as ?), an iodine-based compound (marked as ?) and an allergen reduction filler (marked as ?).Type: ApplicationFiled: January 17, 2014Publication date: May 15, 2014Applicants: DAIWA CO., LTD., SHOUEI CO., LTD., YACHIYO CO., LTD.Inventors: Kohei Yamada, Mitsuo Hori
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Publication number: 20130336837Abstract: A lead-free solder alloy for a vehicle glass according to the present invention contains 26.0 to 56.0 mass % of In, 0.1 to 5.0 mass % of Ag, 0.002 to 0.05 mass % of Ti, 0.001 to 0.01 mass % of Si and the balance being Sn. The lead-free solder alloy may optionally contain 0.005 to 0.1 mass % of Cu and 0.001 to 0.01 mass % of B. This solder alloy can suitably be applied vehicle glasses and show good joint strength to glass materials and high acid resistance, salt water resistance and temperature cycle resistance.Type: ApplicationFiled: February 27, 2012Publication date: December 19, 2013Applicant: Central Glass Company, LimitedInventors: Mizuki Nishi, Takayuki Ogawa, Mitsuo Hori
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Publication number: 20110180311Abstract: A solder material with favorable mechanical properties and high corrosion resistance is provided. The solder material is not apt to be melted in a re-heating process after the soldering process is performed. The solder material includes first solder powder, Cu powder, and a flux. The first solder powder contains Cu, Si, Ti, and Sn. Here, Cu accounts for 7 wt %˜9 wt %, Si accounts for 0.001 wt %˜0.05 wt %, Ti accounts for 0.001 wt %˜0.05 wt %, and the rest is Sn. The Cu powder is coated by Ag. The flux is mixed with the first solder powder and the Cu powder.Type: ApplicationFiled: January 19, 2011Publication date: July 28, 2011Applicant: NIHON DEMPA KOGYO CO., LTD.Inventors: TOSHIMASA TSUDA, MITSUO HORI
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Publication number: 20090325446Abstract: An organic damping material which by itself has excellent damping properties without being combined with other material(s), need not have a certain thickness or volume for ensuring sufficient damping performance, and is easy to process. It is characterized by comprising a polymer matrix phase and a phase dispersed therein comprising one or two or more compounds selected among-(p-toluenesulfonylamido)diphenylamine, 4,4?-bis(?,?-dimethylbenzyl)diphenylamine, octylated diphenylamine, 2,2?-methylenebis(4-ethyl-6-tert-butylphenol, 4,4?-thiobis(3-methyl-6-tert-butylphenol.Type: ApplicationFiled: June 19, 2009Publication date: December 31, 2009Applicant: As R&D LLCInventors: Mitsuo Hori, Akira Saitou, Takashi Hori
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Patent number: 7532994Abstract: A test apparatus for testing an electronic device by providing test signals to the electronic device and comparing multiple output signals with respective anticipated values is disclosed, the test apparatus including: a reference timing detecting unit for detecting that one of the output signals has changed; a setting unit for setting beforehand a minimum time from changing of the output signal to changing of another output signal; an acquisition unit for acquiring the value of the latter output signal at a timing at which the minimum time has elapsed from detection of change of the former output signal; and a determination unit for determining the electronic device to be defective in the event that the value of the latter output signal thus acquired does not match the value which the latter output signal should assume following elapsing of the minimum time.Type: GrantFiled: March 31, 2006Date of Patent: May 12, 2009Assignee: Advantest CorporationInventors: Hideki Tada, Mitsuo Hori, Takahiro Kataoka, Hiroyuki Sekiguchi
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Patent number: 7506291Abstract: A test emulator for emulating a test of a semiconductor device is provided. The test emulator includes a test pattern providing means for providing a test pattern to a device simulator which simulates the operation of a semiconductor device, an expected value storage means for associating a comparison timing at which an output signal outputted from the device simulator according to the test pattern is compared with an predetermined expected value with the expected value at the comparison timing and previously storing therein the same, a margin determination means for determining the size of a margin between which the output signal corresponds to the expected value when the output signal corresponds to the expected value at the comparison timing and a notification means for notifying a user that the margin at the comparison timing is small when the size of margin is smaller than a reference value.Type: GrantFiled: August 24, 2005Date of Patent: March 17, 2009Assignee: Advantest CorporationInventors: Hideki Tada, Mitsuo Hori, Takahiro Kataoka
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Patent number: 7502724Abstract: A test simulator for simulating a test of a semiconductor device is disclosed, the test simulator including: a test pattern holding unit for holding an existing test pattern to be supplied to the semiconductor device; a device output holding unit for preliminarily holding an output to be obtained from the semiconductor device when the existing test pattern is supplied; a test pattern generating unit for generating a new test pattern to be supplied to the semiconductor device; a test pattern deciding unit for deciding whether the new test pattern is equal to the existing test pattern; and a simulation skipping unit for skipping at least a part of a simulation test by reading an output from the device output holding unit and using the output as an output for the new test pattern without supplying the new test pattern to the semiconductor device when the test patterns are equal to each other.Type: GrantFiled: September 30, 2005Date of Patent: March 10, 2009Assignee: Advantest CorporationInventors: Hideki Tada, Mitsuo Hori, Takahiro Kataoka
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Patent number: 7346651Abstract: A method is designed for searching contents information presented by a plurality of information sites over a network based on a query sent from a client terminal to a searching server through the network.Type: GrantFiled: December 17, 2001Date of Patent: March 18, 2008Assignee: Yamaha CorporationInventors: Yasushi Kurakake, Mitsuo Hori
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Patent number: 7269773Abstract: A test program debugging apparatus of the present invention includes a device under test simulator and a semiconductor testing apparatus simulator. Further, the semiconductor testing apparatus simulator includes: a verification range acquiring unit that acquires a verification range that is a range of commands to be verified among commands included in the test program; a command simplifying unit that simplifies non-setting commands other than setting commands for setting the device under test simulator, among non-verification range commands included in a non-verification range that is a range other than the verification range within the test program; and a command executing unit that executes the verification range commands included in the verification range, the setting commands, and the non-setting commands simplified by the command simplifying unit.Type: GrantFiled: August 24, 2005Date of Patent: September 11, 2007Assignee: Advantest CorporationInventors: Mitsuo Hori, Hideki Tada, Takahiro Kataoka, Hiroyuki Sekiguchi, Kazuo Mukawa
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Publication number: 20060248390Abstract: A test program debugging apparatus of the present invention includes a device under test simulator and a semiconductor testing apparatus simulator. Further, the semiconductor testing apparatus simulator includes: a verification range acquiring unit that acquires a verification range that is a range of commands to be verified among commands included in the test program; a command simplifying unit that simplifies non-setting commands other than setting commands for setting the device under test simulator, among non-verification range commands included in a non-verification range that is a range other than the verification range within the test program; and a command executing unit that executes the verification range commands included in the verification range, the setting commands, and the non-setting commands simplified by the command simplifying unit.Type: ApplicationFiled: August 24, 2005Publication date: November 2, 2006Applicant: Advantest CorporationInventors: Mitsuo Hori, Hideki Tada, Takahiro Kataoka, Hiroyuki Sekiguchi, Kazuo Mukawa
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Publication number: 20060247882Abstract: Acceptability of an electronic device is determined with higher precision by performing testing regarding correlation of the timing at which multiple output signals output from the electronic device change.Type: ApplicationFiled: March 31, 2006Publication date: November 2, 2006Applicant: Advantest CorporationInventors: Hideki Tada, Mitsuo Hori, Takahiro Kataoka, Hiroyuki Sekiguchi
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Publication number: 20060085682Abstract: There is provided a test simulator simulating a test of a semiconductor device, which includes: a test pattern holding means for holding an existing test pattern to be supplied to the semiconductor device; a device output holding means for previously holding an output to be obtained from the semiconductor device when the existing test pattern is supplied; a test pattern generating means for generating a new test pattern to be supplied to the semiconductor device; a test pattern deciding means for deciding whether the new test pattern is equal to the existing test pattern; and a simulation skipping means for skipping at least a part of a simulation test by reading an output from the device output holding means and using the output as an output for the new test pattern without supplying the new test pattern to the semiconductor device when the test patterns are equal to each other.Type: ApplicationFiled: September 30, 2005Publication date: April 20, 2006Applicant: Advantest CorporationInventors: Hideki Tada, Mitsuo Hori, Takahiro Kataoka
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Publication number: 20060064607Abstract: A test emulator for emulating a test of a semiconductor device is provided. The test emulator includes a test pattern providing means for providing a test pattern to a device simulator which simulates the operation of a semiconductor device, an expected value storage means for associating a comparison timing at which an output signal outputted from the device simulator according to the test pattern is compared with an predetermined expected value with the expected value at the comparison timing and previously storing therein the same, a margin determination means for determining the size of a margin between which the output signal corresponds to the expected value when the output signal corresponds to the expected value at the comparison timing and a notification means for notifying a user that the margin at the comparison timing is small when the size of margin is smaller than a reference value.Type: ApplicationFiled: August 24, 2005Publication date: March 23, 2006Applicant: Advantest CorporationInventors: Hideki Tada, Mitsuo Hori, Takahiro Kataoka
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Patent number: 6645586Abstract: The present invention provides an energy conversion composition which has an excellent capability of absorbing and damping energy such as dynamic, thermal, or electric energy. The composition can be made into a very thin and small but excellent damping product. The energy conversion composition is characterized in that its base material contains a moment activator which can increase the amount of dipole moments in the base material. The energy conversion composition can be utilized as a vibration damping, sound absorptive, impact absorptive, vibration-proof, electromagnetic wave absorptive, piezoelectric, and endothermal material as well as a polarity liquid.Type: GrantFiled: March 22, 1999Date of Patent: November 11, 2003Assignee: Shishiai-KabushikigaishaInventors: Yasuyuki Ohira, Mitsuo Hori
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Patent number: 6635327Abstract: The present invention provides an energy conversion composition which has an excellent capability of absorbing and damping energy such as dynamic, thermal, or electric energy. The composition can be made into a very thin and small but excellent damping product. The energy conversion composition is characterized in that its base material contains a moment activator which can increase the amount of dipole moments in the base material. The energy conversion composition can be utilized as a vibration damping, sound absorptive, impact absorptive, vibration-proof, electromagnetic wave absorptive, piezoelectric, and endothermal material as well as a polarity liquid.Type: GrantFiled: August 8, 2001Date of Patent: October 21, 2003Assignee: Shishiai-KabushikigaishaInventors: Yasuyuki Ohira, Mitsuo Hori
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Patent number: 6515211Abstract: Display device is supplied with basic screen display data for displaying a basic screen including a plurality of chord names to be indicated on the basic screen, and displays the basic screen on the basis of the basic screen display data. For example, the basic screen may be one listing names of chords to be used in a selected music piece in accordance with progression of the selected music piece. There is provided a memory storing, for each chord, playing-manner screen display data for displaying a playing manner screen indicative of a model playing manner corresponding to the chord. On the basis of an instruction by a user, a desired chord is selected from among the plurality of chord names indicated on the basic screen displayed on the display device, and the playing-manner screen display data corresponding to the selected chord name are read out from the memory.Type: GrantFiled: March 25, 2002Date of Patent: February 4, 2003Assignee: Yamaha CorporationInventors: Satoru Umezawa, Mitsuo Hori
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Publication number: 20020160131Abstract: The present invention provides an energy conversion composition which has an excellent capability of absorbing and damping energy such as dynamic, thermal, optical, or electric energy. The composition can be made into a very thin and small but excellent damping product. The energy conversion composition is characterized in that its base material contains a moment activator which can increase the amount of dipole moments in the base material. The energy conversion composition can be utilized as a vibration damping, sound absorptive, impact absorptive, vibration-proof, electromagnetic wave absorptive, piezoelectric, and endothermal material as well as a polarity liquid.Type: ApplicationFiled: March 22, 1999Publication date: October 31, 2002Inventors: YASUYUKI OHIRA, MITSUO HORI
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Publication number: 20020134224Abstract: Display device is supplied with basic screen display data for displaying a basic screen including a plurality of chord names to be indicated on the basic screen, and displays the basic screen on the basis of the basic screen display data. For example, the basic screen may be one listing names of chords to be used in a selected music piece in accordance with progression of the selected music piece. There is provided a memory storing, for each chord, playing-manner screen display data for displaying a playing manner screen indicative of a model playing manner corresponding to the chord. On the basis of an instruction by a user, a desired chord is selected from among the plurality of chord names indicated on the basic screen displayed on the display device, and the playing-manner screen display data corresponding to the selected chord name are read out from the memory.Type: ApplicationFiled: March 25, 2002Publication date: September 26, 2002Applicant: YAMAHA CORPORATIONInventors: Satoru Umezawa, Mitsuo Hori
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Publication number: 20020091683Abstract: A method is designed for searching contents information presented by a plurality of information sites over a network based on a query sent from a client terminal to a searching server through the network.Type: ApplicationFiled: December 17, 2001Publication date: July 11, 2002Applicant: Yamaha CorporationInventors: Yasushi Kurakake, Mitsuo Hori