Patents by Inventor Mitsuo Nanba

Mitsuo Nanba has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 6725878
    Abstract: A gas leakage detection system includes a flow path, a dual mode valve disposed in the flow path, an ultrasonic measuring section including a pair of ultrasonic transducers, disposed in the flow path upstream from the dual mode valve, a flow rate calculation section for computing a flow rate based on a signal from the ultrasonic measuring section, and a control section for controlling the dual mode valve. The control section closes or opens the dual mode valve instantaneously, and the flow rate calculation section computes a flow rate when the dual mode valve is closed. Thus, gas leakage can be decided substantially without stopping a gas flow when a user is using the gas.
    Type: Grant
    Filed: August 1, 2001
    Date of Patent: April 27, 2004
    Assignee: Matsushita Electric Industrial Co., Ltd.
    Inventors: Motoyuki Nawa, Shigeru Iwanaga, Mitsuo Nanba
  • Patent number: 6691582
    Abstract: A gas type identification system includes: a flow path; an ultrasonic measurement section disposed in the flow path, the ultrasonic measurement section including a pair of ultrasonic transducers; a sound velocity calculation section for calculating a sound velocity of a gas flowing through the flow path based on a signal from the ultrasonic measurement section; a sound velocity memory section for previously storing a predetermined sound velocity; and a comparison section for comparing the sound velocity calculated by the sound velocity calculation section with the predetermined sound velocity previously stored in the sound velocity memory section.
    Type: Grant
    Filed: August 1, 2001
    Date of Patent: February 17, 2004
    Assignee: Matsushita Electric Industrial Co., Ltd.
    Inventors: Motoyuki Nawa, Yukio Nagaoka, Mitsuo Nanba
  • Patent number: 6625549
    Abstract: An equipment specifying system of the present invention includes: a flow path for supplying gas to a plurality of pieces of equipment; an ultrasonic propagation signal measuring section for measuring a propagation signal based on a time during which an ultrasonic wave propagates across the flow path; a signal pattern generation section for generating a signal pattern based on a change in a propagation signal; a signal pattern storage section for previously storing a plurality of signal patterns respectively corresponding to a plurality of pieces of equipment; a signal pattern comparison section for comparing a signal pattern generated by the signal pattern generation section with a plurality of signal patterns previously stored in the signal pattern storage section; and an equipment specifying section for specifying currently used equipment among a plurality of pieces of equipment, in accordance with the comparison results obtained by the signal pattern comparison section.
    Type: Grant
    Filed: August 1, 2001
    Date of Patent: September 23, 2003
    Assignee: Matsushita Electric Industrial Co., Ltd.
    Inventors: Motoyuki Nawa, Mitsuo Nanba
  • Patent number: 5237200
    Abstract: A vertical bipolar transistor arrangement in which the distance between the emitter and the isolation region is kept within a range determined by the sum of emitter depth and base width (i.e., the thickness of the base in the depth direction). This keeps the carriers given by the emitter from getting trapped inside, thereby preventing the cut-off frequency from dropping.
    Type: Grant
    Filed: February 11, 1992
    Date of Patent: August 17, 1993
    Assignee: Hitachi, Ltd.
    Inventors: Mitsuo Nanba, Tohru Nakamura, Nakazato Kazuo, Takeo Shiba, Katsuyoshi Washio, Kiyoji Ikeda, Takahiro Onai, Masatada Horiuchi
  • Patent number: 5227329
    Abstract: A boron doped amorphous silicon film is formed by CVD under the conditions of a pressure lower than 1 atm and a temperature higher than 200.degree. C. and lower than 400.degree. C. by using at least one of disilane and trisilane, and diborane as source gases. Since the resultant amorphous silicon film can diffuse impurities at a lower temperature than in the case of the polycrystalline silicon film formed by the conventional method, a pn junction much shallower than in the prior art can be formed.
    Type: Grant
    Filed: August 30, 1991
    Date of Patent: July 13, 1993
    Assignee: Hitachi, Ltd.
    Inventors: Takashi Kobayashi, Shimpei Iijima, Atsushi Hiraiwa, Nobuyoshi Kobayashi, Takashi Hashimoto, Mitsuo Nanba
  • Patent number: 5214497
    Abstract: A semiconductor device including a polycrystalline silicone resistor which has a resistance of 40 k.OMEGA.-800 k.OMEGA. and which is formed by a polycrystalline silicon film having a specific resistivity of 0.01 .OMEGA..cm-0.1 .OMEGA..cm. The resistor having the above resistance, which has previously been difficult to fabricate, can be fabricated with a high accuracy, so it is very useful for several kinds of semiconductor integrated circuits such as bipolar memory.
    Type: Grant
    Filed: April 8, 1991
    Date of Patent: May 25, 1993
    Assignee: Hitachi, Ltd.
    Inventors: Mitsuo Nanba, Masao Kondo, Takeo Shiba, Tohru Nakamura
  • Patent number: 5109263
    Abstract: A vertical bipolar transistor arrangement in which the distance between the emitter and the isolation region is kept within a range determined by the sum of emitter depth and base width (i.e., the thickness of the base in the depth direction). This keeps the carriers given by the emitter from getting trapped inside, thereby preventing the cut-off frequency from dropping.
    Type: Grant
    Filed: July 24, 1990
    Date of Patent: April 28, 1992
    Assignee: Hitachi, Ltd.
    Inventors: Mitsuo Nanba, Tohru Nakamura, Kazuo Nakazato, Takeo Shiba, Katsuyoshi Washio, Kiyoji Ikeda, Takahiro Onai, Masatada Horiuchi
  • Patent number: 4584421
    Abstract: Plastic scraps are subjected to thermal decomposition in the presence of zeolite type catalyst and converted into a liquid hydrocarbon oil.
    Type: Grant
    Filed: March 26, 1984
    Date of Patent: April 22, 1986
    Assignees: Agency of Industrial Science and Technology, Ministry of International Trade and Industry, Sun-Esu Co., Ltd.
    Inventors: Kiyoshi Saito, Mitsuo Nanba
  • Patent number: 4373975
    Abstract: Alumina or aluminum is arranged on, or in the vicinity of, a wafer surface into which an impurity, particularly antimony, is to be diffused, and the impurity is vapor-diffused.The impurity can be diffused in much larger quantities than in a prior art vapor diffusion, and a very low sheet resistance for the diffused layer of antimony can be attained.
    Type: Grant
    Filed: January 26, 1981
    Date of Patent: February 15, 1983
    Assignee: Hitachi, Ltd.
    Inventors: Mitsuo Nanba, Masahiko Ogirima, Hirotsugu Kozuka, Akira Shintani