Patents by Inventor Mitsuo Yasaka

Mitsuo Yasaka has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7974067
    Abstract: In a plasma processing apparatus having an electrostatic chuck for holding a semiconductor wafer by an electrostatic adsorption force and a DC power supply for applying an electrostatic adsorption voltage to the electrostatic chuck, abnormal discharge in plasma is suppressed by providing the apparatus with a signal detector that detects a foresee signal that foresees occurrence of abnormal discharge in plasma, and a controller that controls ESC leakage current based upon the foresee signal. If the foresee signal is outside a prescribed range, control is exercised so as to reduce the absolute value of the electrostatic adsorption voltage, thereby suppressing the occurrence of an abnormal discharge.
    Type: Grant
    Filed: September 1, 2006
    Date of Patent: July 5, 2011
    Assignee: Renesas Electronics Corporation
    Inventors: Natsuko Ito, Mitsuo Yasaka, Fumihiko Uesugi, Yousuke Itagaki
  • Publication number: 20070058322
    Abstract: In a plasma processing apparatus having an electrostatic chuck for holding a semiconductor wafer by an electrostatic adsorption force and a DC power supply for applying an electrostatic adsorption voltage to the electrostatic chuck, abnormal discharge in plasma is suppressed by providing the apparatus with a signal detector that detects a foresee signal that foresees occurrence of abnormal discharge in plasma, and a controller that controls ESC leakage current based upon the foresee signal. If the foresee signal is outside a prescribed range, control is exercised so as to reduce the absolute value of the electrostatic adsorption voltage, thereby suppressing the occurrence of an abnormal discharge.
    Type: Application
    Filed: September 1, 2006
    Publication date: March 15, 2007
    Inventors: Natsuko Ito, Mitsuo Yasaka, Fumihiko Uesugi, Yousuke Itagaki
  • Publication number: 20050194094
    Abstract: This invention relates to a detection port type probe, a plasma monitoring device, and a plasma processing apparatus. It is intended to directly and conveniently detect a state of plasma generated by an application of a radio frequency or a high voltage, and the detection port type probe is provided with at least an electroconductive supporting member (5) having an opening formed on at least a part of a surface thereof facing to plasma and a dielectric member (1) having a probe electrode (2) formed on one side thereof positioned at the opening of the electroconductive supporting member (5).
    Type: Application
    Filed: March 28, 2003
    Publication date: September 8, 2005
    Inventor: Mitsuo Yasaka
  • Patent number: 6753499
    Abstract: An anomalous arc discharge detection apparatus, including multiplicity of ultrasonic detectors placed at different sections of a plasma processing chamber such that an ultrasonic wave accompanying an anomalous discharge is detected by the ultrasonic detectors at different propagation times or with different delay times. The detected signals are compared with each other on the same time axis to obtain the maximum range of variation of the detected waveforms and the differences in delay time of the respective ultrasonic detectors. From the comparison of the maximum range of variation and the delay times of the ultrasonic detectors, the position of the source point, and the level as well, of the anomalous arc discharge are determined, which can be displayed on a monitor and utilized to issue an alarm if necessary.
    Type: Grant
    Filed: November 28, 2001
    Date of Patent: June 22, 2004
    Assignees: Japan Science and Technology Corporation, Kumamoto Technopolice Foundation
    Inventors: Mitsuo Yasaka, Masayoshi Takeshita