Patents by Inventor Mitsuro Seki

Mitsuro Seki has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8676547
    Abstract: It is an object to provide a parameter extraction method using a model equation having a physical meaning, in which parameters optimum for an element are extracted without setting appropriate initial values based on experience or deep understanding of models and actual device characteristics. A structure is provided in which multiple patterns of initial values of parameters are generated by a random number generator mechanism, and automatic parameter extraction is executed for each initial value to select a combination of parameters in which ultimate difference between a calculated value and a measured value is minimized thereby finding an optimal solution.
    Type: Grant
    Filed: April 17, 2007
    Date of Patent: March 18, 2014
    Assignee: Semiconductor Energy Laboratory Co., Ltd.
    Inventor: Mitsuro Seki
  • Patent number: 7617056
    Abstract: A structure includes a step of inputting a numerical value of a parameter, which forms a model formula, by a computer; a step of inputting the numerical value of the parameter to the model formula and calculating a calculation value by the computer; and a step of evaluating degree of a match between an actual measurement value and the calculation value by the computer with an input/output response of an actual device assumed as the actual measurement value, in which the degree of the match is evaluated by a numerical value corresponding to an area of a portion sandwiched between a connecting line of the actual measurement value and a connecting line of the calculation value.
    Type: Grant
    Filed: December 21, 2006
    Date of Patent: November 10, 2009
    Assignee: Semiconductor Energy Laboratory Co., Ltd.
    Inventor: Mitsuro Seki
  • Publication number: 20070260433
    Abstract: It is an object to provide a parameter extraction method using a model equation having a physical meaning, in which parameters optimum for an element are extracted without setting appropriate initial values based on experience or deep understanding of models and actual device characteristics. A structure is provided in which multiple patterns of initial values of parameters are generated by a random number generator mechanism, and automatic parameter extraction is executed for each initial value to select a combination of parameters in which ultimate difference between a calculated value and a measured value is minimized thereby finding an optimal solution.
    Type: Application
    Filed: April 17, 2007
    Publication date: November 8, 2007
    Inventor: Mitsuro Seki
  • Publication number: 20070150251
    Abstract: A structure includes a step of inputting a numerical value of a parameter, which forms a model formula, by a computer; a step of inputting the numerical value of the parameter to the model formula and calculating a calculation value by the computer; and a step of evaluating degree of a match between an actual measurement value and the calculation value by the computer with an input/output response of an actual device assumed as the actual measurement value, in which the degree of the match is evaluated by a numerical value corresponding to an area of a portion sandwiched between a connecting line of the actual measurement value and a connecting line of the calculation value.
    Type: Application
    Filed: December 21, 2006
    Publication date: June 28, 2007
    Inventor: Mitsuro Seki