Patents by Inventor Mitsuyo Koya

Mitsuyo Koya has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7962292
    Abstract: A sample analyzer optically measures reaction of a sample mixed with reagent, and obtains optical information therefrom; generates a reaction curve representing change in the optical information over time; determines a first area prior to an evaluation target time (t0) and a second area after the evaluation target time (t0) wherein the first and second areas are formed between a baseline which is parallel to the time axis and a reaction curve from a first time (t1) prior to the optional evaluation target time (t0) to a second time (t2) after the evaluation target time, and determines the reaction end point based on the first and second areas; and obtains a characteristic of a sample based on the determined reaction end point, is disclosed. a sample analyzing method is also disclosed.
    Type: Grant
    Filed: January 31, 2008
    Date of Patent: June 14, 2011
    Assignee: Sysmex Corporation
    Inventors: Naohiko Matsuo, Hiroyuki Fujino, Mitsuyo Koya, Susumu Hoshiko
  • Publication number: 20080183431
    Abstract: A sample analyzer optically measures reaction of a sample mixed with reagent, and obtains optical information therefrom; generates a reaction curve representing change in the optical information over time; determines a first area prior to an evaluation target time (t0) and a second area after the evaluation target time (t0) wherein the first and second areas are formed between a baseline which is parallel to the time axis and a reaction curve from a first time (t1) prior to the optional evaluation target time (t0) to a second time (t2) after the evaluation target time, and determines the reaction end point based on the first and second areas; and obtains a characteristic of a sample based on the determined reaction end point, is disclosed a sample analyzing method is also disclosed.
    Type: Application
    Filed: January 31, 2008
    Publication date: July 31, 2008
    Inventors: Naohiko Matsuo, Hiroyuki Fujino, Mitsuyo Koya, Susumu Hoshiko