Abstract: A contact probe for carrying out an electric test by being brought into contact with respective terminals of a liquid crystal display device and a liquid crystal display testing device utilizing such a contact probe. The contact probe has a structure which may include a metal film attached to a nonconductive resin film, which prevents intervals between contact pins from being changed, for example based on changes in humidity. A nonconductive resin film may also be attached on the metal film. An elastic film may also be attached to a nonconductive resin film to ensure a proper orientation of contact pins in a testing operation. The liquid crystal display testing device can utilize such contact probes.

Abstract: A probe device having a contact probe including a film, a plurality of wiring patterns formed on the film with each wiring pattern having a front end portion projecting from the film so as to form contact pins, and a metal layer provided on the film. In one embodiment, the contact probe device includes first and second contact probes connected to each other, the first contact probe including a first film, and a plurality of first wiring patterns formed on the first film, each first wiring pattern having a front end portion projecting from the first film so as to form contact pins. The second contact probe includes a second film, and a plurality of second wiring patterns formed on the second film. The plurality of second wiring patterns are connected to the plurality of first wiring patterns, and the second contact probe is formed separately from the first contact probe.