Patents by Inventor Miyoko Shimizu

Miyoko Shimizu has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Electron microscope
    Patent number: 7064326
    Abstract: An electron microscope is offered which can analyze the three-dimensional structure of a specimen without sectioning it by making use of computerized tomography. The microscope has solved the problems intrinsic to the microscope and permits application of computerized tomography to general cases. A series of transmission images is obtained by tilting the specimen by plural angles. Two-dimensional correlation processing is performed between each of the series of images and a reference image. The same field of view is selected and extracted. Thus, positional deviation of the specimen is corrected.
    Type: Grant
    Filed: June 24, 2004
    Date of Patent: June 20, 2006
    Assignees: JEOL Ltd., JEOL System Technology Co., Ltd.
    Inventors: Hiromitsu Furukawa, Miyoko Shimizu
  • Electron microscope
    Publication number: 20050029452
    Abstract: An electron microscope is offered which can analyze the three-dimensional structure of a specimen without sectioning it by making use of computerized tomography. The microscope has solved the problems intrinsic to the microscope and permits application of computerized tomography to general cases. A series of transmission images is obtained by tilting the specimen by plural angles. Two-dimensional correlation processing is performed between each of the series of images and a reference image. The same field of view is selected and extracted. Thus, positional deviation of the specimen is corrected.
    Type: Application
    Filed: June 24, 2004
    Publication date: February 10, 2005
    Applicants: JEOL Ltd., JEOL System Technology Co., Ltd.
    Inventors: Hiromitsu Furukawa, Miyoko Shimizu