Patents by Inventor Mizuki MATSUO

Mizuki MATSUO has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20230238250
    Abstract: An etching method and a plasma processing apparatus form a recess with an intended shape. The etching method includes (a) providing a substrate, the substrate including a silicon-containing film and a mask on the silicon-containing film; (b) etching the silicon-containing film with a first plasma to form a recess, the first plasma generated from a first process gas; (c) supplying a second plasma to the substrate, the second plasma generated from a second process gas comprising tungsten; and (d) etching the recess with a third plasma generated from a third process gas.
    Type: Application
    Filed: January 12, 2023
    Publication date: July 27, 2023
    Applicant: Tokyo Electron Limited
    Inventor: Mizuki MATSUO
  • Publication number: 20230238247
    Abstract: An etching method and a plasma processing apparatus form a recess with an intended shape. The etching method includes (a) providing a substrate including a silicon-containing film and a mask on the silicon-containing film. The silicon-containing film including a first region and a second region having a boundary therebetween as viewed in cross section in a direction perpendicular to a plane direction of the substrate. The boundary includes a slope extending in a direction inclined with respect to the plane direction. The method further includes (b) etching, after (a), the first region with first plasma generated from a first process gas to form a recess, (c) supplying, after (b), second plasma generated from a second process gas containing tungsten to the substrate, and (d) etching, after (c), the recess with third plasma generated from a third process gas. The recess crosses the slope in the cross section after (d).
    Type: Application
    Filed: January 12, 2023
    Publication date: July 27, 2023
    Applicant: Tokyo Electron Limited
    Inventor: Mizuki MATSUO
  • Publication number: 20220319860
    Abstract: An etching method of a substrate includes (a) providing a substrate on a substrate support inside a chamber, the substrate including a first region having a multilayer film in which a silicon oxide film and a silicon nitride film are alternately stacked and a second region having a monolayer silicon oxide film; and (b) etching the substrate with plasma generated from a first processing gas that includes a hydrofluorocarbon gas, wherein the hydrofluorocarbon gas includes a first hydrofluorocarbon gas represented by CxHyFz (x represents an integer of 2 or more, and y and z represent an integer of 1 or more) and having an unsaturated bond.
    Type: Application
    Filed: March 29, 2022
    Publication date: October 6, 2022
    Applicant: Tokyo Electron Limited
    Inventors: Akira NAKAGAWA, Takumi WATANABE, Akira TANABE, Mizuki MATSUO, Torai IWASA