Abstract: A method and apparatus for calibrating a pipelined analog-to-digital converter (ADC) is disclosed. A method includes reading a first output level from a first sub-ADC, reading one or more additional output levels from one or more additional sub-ADCs, combining the one or more additional output levels from the one or more additional sub-ADCs into a combined output level, and adjusting a comparator threshold of the first sub-ADC when the first output level and the combined output level meet a set of predetermined conditions.

Abstract: An electronic device is disclosed that includes an analog-to-digital converter circuit, an adaptive filter circuit coupled to the analog-to-digital converter circuit to correct one or more circuit impairments in the analog-to-digital converter circuit, a training signal generator circuit to generate training signals, and an amplitude detector circuit configured to suspend generation of the training signals and cause the adaptive filter circuit to suspend adaptation when the input signal is above a predetermined threshold.

Abstract: A method and apparatus for calibrating a CDAC-based analog-to-digital converter is disclosed. In one aspect, a calibration method includes: applying a predetermined pattern of voltages to first plates of a group of N capacitors, wherein N is an integer greater than 1; applying a zero voltage to the second plates of the group of N capacitors, wherein the second plates of the group of N capacitors are connected in common; removing the zero voltage to the second plates of the group of N capacitors; applying a zero voltage to all of the first plates of the group of N capacitors; quantizing a voltage on the second plates of the group of N capacitors; converting the quantized voltage on the second plates of the group of N capacitors to an adjustment value; and loading the adjustment value into a lookup table.