Abstract: To compensate for inaccuracies in reported values for current output from a voltage regulator (VR) to a processor, the VR may be tested, and a load line determined so the processor can calculate the inaccuracy. This load line may be programmed into the BIOS as an offset, and the BIOS values used from then on so the CPU can determine what the true inaccuracy is, as opposed to the inaccuracy requested of the VR manufacturer. These values may be used during operation to control CPU turbo mode and CPU throttling.

Abstract: To compensate for inaccuracies in reported values for current output from a voltage regulator (VR) to a processor, the VR may be tested, and a load line determined so the processor can calculate the inaccuracy. This load line may be programmed into the BIOS as an offset, and the BIOS values used from then on so the CPU can determine what the true inaccuracy is, as opposed to the inaccuracy requested of the VR manufacturer. These values may be used during operation to control CPU turbo mode and CPU throttling.

Abstract: Apparatuses, methods, and systems associated with and/or having components capable of, detecting a temperature of an integrated circuit in real time during testing are disclosed herein. In exemplary embodiments, an integrated circuit includes a register to store a temperature limit for the integrated circuit; a temperature sensor formed on the integrated circuit to sense a temperature of the integrated circuit, and output a signal indicative of the temperature sensed, based at least in part on the temperature sensed; and testing logic coupled to the register and the temperature sensor to record a temperature violation if at any time during a testing mode of operation the temperature sensed by the temperature sensor violates the stored temperature limit.

Abstract: Apparatuses, methods, and systems associated with and/or having components capable of, detecting a temperature of an integrated circuit in real time during testing are disclosed herein. In exemplary embodiments, an integrated circuit includes a register to store a temperature limit for the integrated circuit; a temperature sensor formed on the integrated circuit to sense a temperature of the integrated circuit, and output a signal indicative of the temperature sensed, based at least in part on the temperature sensed; and testing logic coupled to the register and the temperature sensor to record a temperature violation if at any time during a testing mode of operation the temperature sensed by the temperature sensor violates the stored temperature limit.