Abstract: A test station for use with automated test equipment (ATE) in testing printed circuit boards (PCBs). The test station comprises a support frame to which are attached substantially identical test wells for sequentially performing tests on the PCBs. The test wells are attached to the frame through a mechanism that allows the test wells to be adjustably positioned between an idle position and a testing position that is in proximity with the ATE. Each of the test wells contains upper and lower conveyor segments and a test head disposed between the conveyor segments. The conveyor segments of the respective test wells variously align in accordance with vertical movement of the test wells so as to enable transverse movement of the PCBs into, through and out of the test station.

Abstract: A method for testing printed circuit boards (PCBs). The PCBs are initially transported to a reorienting apparatus that aligns the PCBs to accommodate automated test equipment (ATE). The ATE consists essentially of two stations interconnected by a conveyor. At the first station testing of PCBs occurs sequentially at two test wells that are vertically movable between respective idle and testing positions. Upon being discharged from the first test station, a predetermined number of PCBs are concatenated along the conveyor that connects the first test station to the second test station. The concatenated PCBs are delivered to the second test station that simultaneously performs a second test on the predetermined number of PCBs. Inasmuch as the first test is of a duration substantially shorter than the second test, the concatenation of a number of PCBs prior to performance of the second test compensates for the difference in respective durations.