Abstract: Structures and methods of fabrication are provided with reduced or cancelled stress within the substrate of the structure adjacent to a through-substrate via. The fabrication method(s) includes: forming a structure with a through-substrate via (TSV) having a reduced device keep-out zone (KOZ) adjacent to the through-substrate via, the forming including: providing the through-substrate via within a substrate of the structure; and providing a stress-offset layer above the substrate selected and configured to provide a desired offset stress to reduce stress within the substrate caused by the presence of the through-substrate via within the substrate. In one embodiment, the stress-offset layer provides a desired compressive stress sufficient to reduce or eliminate tensile stress within the substrate due to the presence of the through-substrate via within the substrate.