Patents by Inventor Mohamed Abdel Moneum

Mohamed Abdel Moneum has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Defect analysis
    Patent number: 8064682
    Abstract: In one embodiment, a method to analyze a semiconductor wafer comprises extracting inline defect data from a data source, counting a total number of inline defects and end-of-line defects, terminating the analysis when the total number of inline defects and end-of-line defects exceeds a threshold, and mapping the inline defects onto the end-of-line defects when the total number of inline defects and end-of-line defects is less than a threshold.
    Type: Grant
    Filed: June 29, 2007
    Date of Patent: November 22, 2011
    Assignee: Intel Corporation
    Inventors: Yazan A. Alqudah, Hazem Hajj, Mohamed Abdel Moneum
  • Defect analysis
    Publication number: 20090003684
    Abstract: In one embodiment, a method to analyze a semiconductor wafer comprises extracting inline defect data from a data source, counting a total number of inline defects and end-of-line defects, terminating the analysis when the total number of inline defects and end-of-line defects exceeds a threshold, and mapping the inline defects onto the end-of-line defects when the total number of inline defects and end-of-line defects is less than a threshold.
    Type: Application
    Filed: June 29, 2007
    Publication date: January 1, 2009
    Inventors: Yazan A. Alqudah, Hazem Hajj, Mohamed Abdel Moneum