Abstract: Methods and tools to identify a type of sedimentary system from an XRD pattern. The method includes applying x-rays to a sample to obtain diffraction pattern data, and calculating a March-Dollase preferred orientation factor of a crystallographic plane of the sample based on the diffraction pattern data. The method further includes classifying the calculated March-Dollase preferred orientation factor to identify a type of clastic sedimentary system corresponding to the sample. A rapid sediment analyzer tool includes an X-ray diffraction device and an application having a March-Dollase preferred orientation factor calculator and a classifier. The display device is configured to display the identified type of clastic sedimentary system.

Abstract: Methods for determining a weathering index using x-ray diffraction (XRD) data are provided. An exemplary method includes obtaining XRD data of a weathered rock sample, and calculating the weathering index using a formula developed to use the XRD data.

Abstract: Methods are provided for determining a depositional environment of a sample of a subterranean environment. An example method includes measuring intensities for a crystallographic plane (CP) 100 peak and a CP 101 peak for quartz in a diffractogram, calculating a ratio of the intensities of the CP 100 peak to the CP 101 peak, and identifying a depositional environment for the sample from the ratio.

Abstract: Methods are provided for determining a depositional environment of a sample of a subterranean environment. An example method includes measuring intensities for a crystallographic plane (CP) 100 peak and a CP 101 peak for quartz in a diffractogram, calculating a ratio of the intensities of the CP 100 peak to the CP 101 peak, and identifying a depositional environment for the sample from the ratio.