Patents by Inventor Mohammed Dahleh

Mohammed Dahleh has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 5831181
    Abstract: A modified Atomic Force Microscope (AFM), which can machine and image the surface of a sample with nanometer precision in all three orthogonal directions by varying the depth-of-cut of the sample. A multi-repetitive sensor system is provided as is a radially halved quartered electrode to substantially maintain parallelism or substantial parallelism.
    Type: Grant
    Filed: September 29, 1995
    Date of Patent: November 3, 1998
    Assignee: The Regents of the University of California
    Inventors: Arun Majumdar, Mohammed Dahleh, James Samir Ismail