Patents by Inventor MOHAMMED MAINUL HOQUE

MOHAMMED MAINUL HOQUE has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method and device for determining at least one sample-point-specific vertical total electronic content
    Patent number: 10254409
    Abstract: A device and a method determine a sample point specific vertical total electronic content which is the electron content along a sample point specific vertical path that extends through the center of the earth and the sample point. A first inclined total electronic content is determined and refers to the electron content along an inclined beam path. A first and a further sample point along the beam path are selected. An initial sample point specific vertical total electronic content is determined for each sample point. An increment electron content is determined and refers to the electron content of the increment associated with the sample point. A further inclined total electronic content is determined. A sample point specific conversion function is determined. The sample point specific vertical total electronic content is determined from the first inclined total electronic content and the sample point specific conversion function.
    Type: Grant
    Filed: September 15, 2014
    Date of Patent: April 9, 2019
    Assignee: Deutsches Zentrum fuer Luft- und Raumfahrt e.V.
    Inventors: Norbert Jakowski, Mohammed Mainul Hoque
  • Method and Device for Determining at least one Sample-Point-Specific Vertical Total Electronic Content
    Publication number: 20160282472
    Abstract: A device and a method determine a sample point specific vertical total electronic content which is the electron content along a sample point specific vertical path that extends through the center of the earth and the sample point. A first inclined total electronic content is determined and refers to the electron content along an inclined beam path. A first and a further sample point along the beam path are selected. An initial sample point specific vertical total electronic content is determined for each sample point. An increment electron content is determined and refers to the electron content of the increment associated with the sample point. A further inclined total electronic content is determined. A sample point specific conversion function is determined. The sample point specific vertical total electronic content is determined from the first inclined total electronic content and the sample point specific conversion function.
    Type: Application
    Filed: September 15, 2014
    Publication date: September 29, 2016
    Inventors: NORBERT JAKOWSKI, MOHAMMED MAINUL HOQUE