Patents by Inventor Mohammed Massoodi

Mohammed Massoodi has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method and system for locating chip-level defects through emission imaging of a semiconductor device
    Patent number: 6995564
    Abstract: Aspects for locating chip-level defects through emission imaging of a semiconductor device are described. The aspects include providing a semiconductor device for inspection within an emission imaging system. Emission detection from a frontside and backside of the semiconductor device substantially simultaneously is then performed in the emission imaging system, wherein the emissions detected indicate potential defects within the semiconductor device.
    Type: Grant
    Filed: January 15, 2003
    Date of Patent: February 7, 2006
    Assignee: Advanced Micro Devices, Inc.
    Inventors: Boon Y. Ang, Mehrdad Mahanpour, Mohammed Massoodi