Patents by Inventor Mohan NIKAM

Mohan NIKAM has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 12437523
    Abstract: Embodiments of the present disclosure discuss a system and a method for anomaly detection in an object. Conventional systems of defect detection require labeled training data. Further, current anomaly detection systems cannot be easily incorporated into factory production systems. Embodiments of the present disclosure address this problem by using a convolutional neural network (CNN) and feature based memories such as neural network based memories for anomaly detection. The method described in the embodiments uses neural network based memories to generate memory feature maps from feature maps extracted at intermediate layers of the CNN. Subsequently, heatmaps are created by calculating feature differences between the feature maps and the memory feature maps. Weighted averaging and post processing is performed on the heatmaps to identify the anomaly in the object.
    Type: Grant
    Filed: April 25, 2022
    Date of Patent: October 7, 2025
    Assignee: JIDOKA TECHNOLOGIES PRIVATE LIMITED
    Inventors: Sekar Udayamurthy, Mohan Nikam, Vinodh Venkatesh, Krishna Iyengar
  • Publication number: 20240378871
    Abstract: Embodiments of the present disclosure discuss a system [100] and a method [200] for refining training images for object detection. Conventional systems provide inaccurate predictions of defects because of erroneous labeling of defects in training images. Further, existing systems focus on improving the algorithms used for object detection. Embodiments of the present disclosure address these problems by using supervised learning techniques and refining the training data provided to train the algorithms. The system [100] refines the training images using predictions of a first model and providing the predictions for human review, and subsequently uses the refined training images to create a second model that can be used in a production environment of an enterprise for object detection.
    Type: Application
    Filed: May 9, 2023
    Publication date: November 14, 2024
    Applicant: JIDOKA TECHNOLOGIES PRIVATE LIMITED
    Inventors: Krishna Ananth IYENGAR, Mohan Nikam
  • Publication number: 20230410484
    Abstract: Embodiments of the present disclosure discuss a system and a method for anomaly detection in an object. Conventional systems of defect detection require labeled training data. Further, current anomaly detection systems cannot be easily incorporated into factory production systems. Embodiments of the present disclosure address this problem by using a convolutional neural network (CNN) and feature based memories such as neural network based memories for anomaly detection. The method described in the embodiments uses neural network based memories to generate memory feature maps from feature maps extracted at intermediate layers of the CNN. Subsequently, heatmaps are created by calculating feature differences between the feature maps and the memory feature maps. Weighted averaging and post processing is performed on the heatmaps to identify the anomaly in the object.
    Type: Application
    Filed: April 25, 2022
    Publication date: December 21, 2023
    Applicant: JIDOKA TECHNOLOGIES PRIVATE LIMITED
    Inventors: Sekar UDAYAMURTHY, Mohan NIKAM, Vinodh VENKATESH, Krishna IYENGAR