Patents by Inventor Mohit Gopalraj

Mohit Gopalraj has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 12072362
    Abstract: Apparatus and methods for characterizing electrical components for evaluating performance in a high voltage transient protection circuit. Impedance graphs provided by manufacturers for electrical components are typically low voltage measurements that do not necessarily accurately reflect component performance at high voltages above 150 volts. It is important to characterize and understand the behavior of these components at high voltages in order to ensure the components will protect circuitry as expected. In certain embodiments, a characterization method includes obtaining time domain voltage measurements from two terminals of a device under test (DUT) as it is exposed to high voltage transients from an electrical fast transient (EFT) generator. The time domain voltage data is transformed into frequency domain voltage data using a transform algorithm, and additional analysis is performed to derive scattering parameters, impedance, and other valuable metrics for component characterization.
    Type: Grant
    Filed: November 2, 2021
    Date of Patent: August 27, 2024
    Assignee: Analog Devices, Inc.
    Inventor: Mohit Gopalraj
  • Publication number: 20230139107
    Abstract: Apparatus and methods for characterizing electrical components for evaluating performance in a high voltage transient protection circuit. Impedance graphs provided by manufacturers for electrical components are typically low voltage measurements that do not necessarily accurately reflect component performance at high voltages above 150 volts. It is important to characterize and understand the behavior of these components at high voltages in order to ensure the components will protect circuitry as expected. In certain embodiments, a characterization method includes obtaining time domain voltage measurements from two terminals of a device under test (DUT) as it is exposed to high voltage transients from an electrical fast transient (EFT) generator. The time domain voltage data is transformed into frequency domain voltage data using a transform algorithm, and additional analysis is performed to derive scattering parameters, impedance, and other valuable metrics for component characterization.
    Type: Application
    Filed: November 2, 2021
    Publication date: May 4, 2023
    Inventor: Mohit Gopalraj