Patents by Inventor Molly Zebrowski

Molly Zebrowski has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8170466
    Abstract: A system and method for automated assessment of constrained constructed responses provides for automatic, e.g., programmatic, assessing of a test subject response to a constrained constructed response item or question. In one embodiment, paper test materials with test subject markings thereon are converted to electronic form. Test subject markings are further isolated, for example, by registration, sizing and removal of markings other than a graphic response. The subject markings are further compared with a baseline response, correctness deviation criteria and incorrectness deviation criteria (e.g., correctness, incorrectness, substantial correctness, substantial incorrectness, and so on) from which one or more of a score, further learning or other assessment results may be determined. Cluster analysis or other post-evaluation or post-assessment processing may also be conducted, or re-evaluation or re-assessment may also be conducted.
    Type: Grant
    Filed: May 26, 2006
    Date of Patent: May 1, 2012
    Assignee: CTB/McGraw-Hill
    Inventors: Sylvia Tidwell-Scheuring, Roger P. Creamer, Molly Zebrowski, David D. S. Poor
  • Publication number: 20060286539
    Abstract: A system and method for automated assessment of constrained constructed responses provides for automatic, e.g., programmatic, assessing of a test subject response to a constrained constructed response item or question. In one embodiment, paper test materials with test subject markings thereon are converted to electronic form. Test subject markings are further isolated, for example, by registration, sizing and removal of markings other than a graphic response. The subject markings are further compared with a baseline response, correctness deviation criteria and incorrectness deviation criteria (e.g., correctness, incorrectness, substantial correctness, substantial incorrectness, and so on) from which one or more of a score, further learning or other assessment results may be determined. Cluster analysis or other post-evaluation or post-assessment processing may also be conducted, or re-evaluation or re-assessment may also be conducted.
    Type: Application
    Filed: May 26, 2006
    Publication date: December 21, 2006
    Applicant: CTB/MCGRAW-HILL
    Inventors: Sylvia Tidwell-Scheuring, Roger Creamer, Molly Zebrowski, David Poor