Patents by Inventor Monghsung Chuang

Monghsung Chuang has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8205173
    Abstract: A method includes providing a plurality of failure dies, and performing a chip probing on the plurality of failure dies to generate a data log comprising electrical characteristics of the plurality of failure dies. An automatic net tracing is performed to trace failure candidate nodes in the failure dies. A failure layer analysis is performed on results obtained from the automatic net tracing. Physical failure analysis (PFA) samples are selected from the plurality of failure dies using results obtained in the step of performing the failure layer analysis.
    Type: Grant
    Filed: June 17, 2010
    Date of Patent: June 19, 2012
    Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
    Inventors: Sunny Wu, Yen-Di Tsen, Monghsung Chuang, Fu-Min Huang, Jo Fei Wang, Jong-I Mou
  • Publication number: 20110314336
    Abstract: A method includes providing a plurality of failure dies, and performing a chip probing on the plurality of failure dies to generate a data log comprising electrical characteristics of the plurality of failure dies. An automatic net tracing is performed to trace failure candidate nodes in the failure dies. A failure layer analysis is performed on results obtained from the automatic net tracing. Physical failure analysis (PFA) samples are selected from the plurality of failure dies using results obtained in the step of performing the failure layer analysis.
    Type: Application
    Filed: June 17, 2010
    Publication date: December 22, 2011
    Applicant: Taiwan Semiconductor Manufacturing Company, Ltd.
    Inventors: Sunny Wu, Yen-Di Tsen, Monghsung Chuang, Fu-Min Huang, Jo Fei Wang, Jong-I Mou