Abstract: Examples relate to control apparatus, a control device, a method and a computer program for determining a device-specific supply voltage for a semiconductor device, and to a corresponding semiconductor device and corresponding systems. The control apparatus is configured to obtain measurement data of measurement circuitry of the semiconductor device, the measurement data being related to a progress of aging of the semiconductor device. The control apparatus is configured to determine the device-specific supply voltage of the semiconductor device based on the measurement data. The control apparatus is configured to provide information on the device-specific supply voltage for a supply voltage control apparatus.

Abstract: The disclosed technology can be used to convert direct-current voltage and current from an input to a different or the same voltage and current at an output. One example direct-current to direct-current (DC-DC) power converter includes a first switch connected between a source voltage and a first side of an inductor, a second switch connected between the first side of the inductor and a ground, a third switch connected between a second side of the inductor and the ground, and a fourth switch connected between the second side of the inductor and a capacitor. The power converter may further include a comparator configured to compare an output voltage at the capacitor to a threshold voltage and based on the result of the comparison selectively activate or deactivate the first, second, third, and fourth switches in a power cycle.

Abstract: The disclosed technology can be used to convert direct-current voltage and current from an input to a different or the same voltage and current at an output. One example direct-current to direct-current (DC-DC) power converter includes a first switch connected between a source voltage and a first side of an inductor, a second switch connected between the first side of the inductor and a ground, a third switch connected between a second side of the inductor and the ground, and a fourth switch connected between the second side of the inductor and a capacitor. The power converter may further include a comparator configured to compare an output voltage at the capacitor to a threshold voltage and based on the result of the comparison selectively activate or deactivate the first, second, third, and fourth switches in a power cycle.

Abstract: The disclosed technology can be used to convert direct-current voltage and current from an input to a different or the same voltage and current at an output. One example direct-current to direct-current (DC-DC) power converter includes a first switch connected between a source voltage and a first side of an inductor, a second switch connected between the first side of the inductor and a ground, a third switch connected between a second side of the inductor and the ground, and a fourth switch connected between the second side of the inductor and a capacitor. The power converter may further include a comparator configured to compare an output voltage at the capacitor to a threshold voltage and based on the result of the comparison selectively activate or deactivate the first, second, third, and fourth switches in a power cycle.

Abstract: In accordance with some embodiments, the way in which the fuses are sensed and, particularly, their order may be made more random so that it is much more difficult to simply exercise the device and determine all the values of the storage elements within the fuse array. One result is a more secure storage device.

Abstract: In accordance with some embodiments, fuse information may be written into a fuse array in a way that provides sufficient redundancy, making it harder for malicious parties to attack the fuse array.

Abstract: In accordance with some embodiments, multiple blind debug passwords are provided. Each of a plurality of interested entities may have its own password and each password may unlock a specific set of features offered by an integrated circuit. In some embodiments each entity does not know the other passwords of the other entities. Potentially interested entities include an integrated circuit end customer, the original equipment manufacturer, the entity that provided the features to the integrated circuit and a conditional access provider. All debug features may be controlled solely via access to the debug tiers which are accessed by multiple debug passwords. Lower tier passwords are required in order to access higher tiers. Debug features may be separated into multiple tiers with more intrusive access requiring multiple debug passwords in order to gain access.

Abstract: In accordance with some embodiments, instead of providing replacement rows, an area within a fuse array may be reserved for storing addresses of bits that are defective. Then these bits can be readily repaired by simply reading the stored state of identified defective bit, and inverting the stored state of the identified defective bit to get the correct output.

Abstract: In one embodiment described herein, on-die programmable fuses may be used. On-die programmable fuses may be programmed by entities other than the chip manufacturer after the fuse array chip has been manufactured and shipped out. However, other non-volatile memories may also be used.

Abstract: In accordance with some embodiments, multiple blind debug passwords are provided. Each of a plurality of interested entities may have its own password and each password may unlock a specific set of features offered by an integrated circuit. In some embodiments each entity does not know the other passwords of the other entities. Potentially interested entities include an integrated circuit end customer, the original equipment manufacturer, the entity that provided the features to the integrated circuit and a conditional access provider. All debug features may be controlled solely via access to the debug tiers which are accessed by multiple debug passwords. Lower tier passwords are required in order to access higher tiers. Debug features may be separated into multiple tiers with more intrusive access requiring multiple debug passwords in order to gain access.

Abstract: In accordance with some embodiments, instead of providing replacement rows, an area within a fuse array may be reserved for storing addresses of bits that are defective. Then these bits can be readily repaired by simply reading the stored state of identified defective bit, and inverting the stored state of the identified defective bit to get the correct output.

Abstract: In one embodiment described herein, on-die programmable fuses may be used. On-die programmable fuses may be programmed by entities other than the chip manufacturer after the fuse array chip has been manufactured and shipped out. However, other non-volatile memories may also be used.

Abstract: In accordance with some embodiments, the way in which the fuses are sensed and, particularly, their order may be made more random so that it is much more difficult to simply exercise the device and determine all the values of the storage elements within the fuse array. One result is a more secure storage device.

Abstract: In accordance with some embodiments, fuse information may be written into a fuse array in a way that provides sufficient redundancy, making it harder for malicious parties to attack the fuse array.