Abstract: The present invention refers to a method for immuno-histochemical staining of a formalin-fixed, paraffin-embedded tissue section comprising the steps of a) providing a solid support, b) mounting the formalin-fixed, paraffin-embedded tissue section onto the solid support, c) removing the paraffin from the formalin-fixed, paraffin-embedded tissue section, d) heating the tissue section mounted on the solid support to retrieve epitopes at 50 to 70° C. for 12 to 24 h, and e) staining the tissue section mounted on the solid support, wherein at least step e) is performed in the presence of 0.5 to 3.0 M sodium chloride. The present invention further refers to a kit for performing the method.

Abstract: The present invention refers to a method for immuno-histochemical staining of a formalin-fixed, paraffin-embedded tissue section comprising the steps of a) providing a solid support, b) mounting the formalin-fixed, paraffin-embedded tissue section onto the solid support, c) removing the paraffin from the formalin-fixed, paraffin-embedded tissue section, d) heating the tissue section mounted on the solid support to retrieve epitopes at 50 to 70° C. for 12 to 24 h, and e) staining the tissue section mounted on the solid support, wherein at least step e) is performed in the presence of 0.5 to 3.0 M sodium chloride. The present invention further refers to a kit for performing the method.

Abstract: The present invention refers to a method for immuno-histochemical staining of a formalin-fixed, paraffin-embedded tissue section comprising the steps of a) providing a solid support, b) mounting the formalin-fixed, paraffin-embedded tissue section onto the solid support, c) removing the paraffin from the formalin-fixed, paraffin-embedded tissue section, d) heating the tissue section mounted on the solid support to retrieve epitopes at 50 to 70° C. for 12 to 24 h, and e) staining the tissue section mounted on the solid support, wherein at least step e) is performed in the presence of 0.5 to 3.0 M sodium chloride. The present invention further refers to a kit for performing the method.

Abstract: The present invention refers to a method for immuno-histochemical staining of a formalin-fixed, paraffin-embedded tissue section comprising the steps of a) providing a solid support, b) mounting the formalin-fixed, paraffin-embedded tissue section onto the solid support, c) removing the paraffin from the formalin-fixed, paraffin-embedded tissue section, d) heating the tissue section mounted on the solid support to retrieve epitopes at 50 to 70° C. for 12 to 24 h, and e) staining the tissue section mounted on the solid support, wherein at least step e) is performed in the presence of 0.5 to 3.0 M sodium chloride. The present invention further refers to a kit for performing the method.

Abstract: An input circuit (1?) provided with a time delay element (40), which circuit is capable of being tested by a controlled high level or low level connection, and a method for the operation thereof. The delay time of the time-delay element can be modified during operation of the input circuit. In particular, the elapsed delay time is read out prior to the testing of the input circuit and is restored again after testing, so that the test does not increase the effective input delay time for the process signals. In addition or as an alternative, the delay time is set to a minimum value prior to the test to enable rapid testing of the input circuit independent of the set delay time.

Abstract: An input circuit (1?) provided with a time delay element (40), which circuit is capable of being tested by a controlled high level or low level connection, and a method for the operation thereof. The delay time of the time-delay element can be modified during operation of the input circuit. In particular, the elapsed delay time is read out prior to the testing of the input circuit and is restored again after testing, so that the test does not increase the effective input delay time for the process signals. In addition or as an alternative, the delay time is set to a minimum value prior to the test to enable rapid testing of the input circuit independent of the set delay time.