Patents by Inventor Montajir Rahman

Montajir Rahman has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 9885695
    Abstract: In order to be able to prevent analysis accuracy from being reduced by a backward flow of sample gas from dead volume in a cleaning mechanism into a cell at the time of analysis, a gas analysis device has an analysis part that analyzes the sample gas introduced into the cell, gas ports that are arranged toward predetermined regions of gas contact surfaces in the cell, and a piping mechanism that connects the gas ports to a predetermined purge gas source, and blows purge gas from the gas ports toward the predetermined regions at the time of purging. The gas analysis device also has a switching part that switches a connecting destination of the piping mechanism from the purge gas source to a predetermined suction part, and at the time of introducing or analyzing the sample gas, connects the gas ports to the suction source.
    Type: Grant
    Filed: February 9, 2012
    Date of Patent: February 6, 2018
    Assignee: Horiba, Ltd.
    Inventors: Shigeru Nakatani, Kenji Hara, Montajir Rahman, Masahiro Nakane
  • Patent number: 9335235
    Abstract: An exhaust gas sampling device is intended to heat or cool a temperature of sampled exhaust gas flowing through a sampling line to a desired temperature in accordance with various exhaust gas conditions and usage conditions of the sampling line irrespective of a temperature of the exhaust gas flowing through an exhaust pipe, and includes the sampling line for sampling the exhaust gas to be introduced into an analyzing instrument; a plurality of heating parts provided along the sampling line from an upstream side to a downstream side for heating the exhaust gas flowing through the sampling line; and a temperature control part for individually setting set temperatures of the plurality of heating parts using the temperature of the exhaust gas in the exhaust pipe and a target temperature of the exhaust gas in an outlet side of the heating part located in the most downstream as parameters.
    Type: Grant
    Filed: February 14, 2013
    Date of Patent: May 10, 2016
    Assignee: HORIBA, LTD.
    Inventors: Montajir Rahman, Masahiro Nakane, Kenji Hara, Shigeru Nakatani
  • Patent number: 8789406
    Abstract: An exhaust gas sampling and analysis system includes a main flow channel in which a flow restriction mechanism and a first suction pump are arranged; a measurement flow channel in which an exhaust gas analysis device is provided and that extends from the main flow channel at a position downstream of the flow restriction mechanism; and a compensation flow channel in which a flow rate adjustment mechanism is provided and that extends from the main flow channel at a position downstream of the point from which the measurement flow channel extends. The first suction pump further reduces the pressure of the exhaust gas. The flow rate adjustment mechanism adjusts, in order that the pressure of the exhaust gas at the point from which the measurement flow channel extends is a predetermined value, the flow rate of the compensation gas.
    Type: Grant
    Filed: July 27, 2010
    Date of Patent: July 29, 2014
    Assignee: Horiba, Ltd.
    Inventors: Montajir Rahman, Takeshi Kusaka, Leslie Hill
  • Publication number: 20140002823
    Abstract: In order to be able to prevent analysis accuracy from being reduced by a backward flow of sample gas from dead volume in a cleaning mechanism into a cell at the time of analysis, a gas analysis device has an analysis part that analyzes the sample gas introduced into the cell, gas ports that are arranged toward predetermined regions of gas contact surfaces in the cell, and a piping mechanism that connects the gas ports to a predetermined purge gas source, and blows purge gas from the gas ports toward the predetermined regions at the time of purging. The gas analysis device also has a switching part that switches a connecting destination of the piping mechanism from the purge gas source to a predetermined suction part, and at the time of introducing or analyzing the sample gas, connects the gas ports to the suction source.
    Type: Application
    Filed: February 9, 2012
    Publication date: January 2, 2014
    Applicant: HORIBA, LTD.
    Inventors: Shigeru Nakatani, Kenji Hara, Montajir Rahman, Masahiro Nakane
  • Patent number: 8564779
    Abstract: This invention makes it possible to measure a concentration of a gas component having the adsorption even thought the concentration is low, and to improve a response speed of the measurement of the concentration, and comprises a body that has an introduction port to introduce a sample gas into a measurement cell, a laser light irradiation part that irradiates the laser light on the measurement cell, a heating pipe that applies heat to the sample gas introduced into the introduction port, a flow rate limit part that makes the sample gas at a negative pressure and that introduces the negative-pressurized heated sample gas into the body, and a negative pressure pump that keeps inside of the measurement cell and a flow channel from a downstream side of the flow rate limit part to the measurement cell at the negative pressure.
    Type: Grant
    Filed: May 17, 2011
    Date of Patent: October 22, 2013
    Assignee: Horiba, Ltd.
    Inventors: Kenji Hara, Montajir Rahman, Shigeru Nakatani, Masahiro Nakane
  • Publication number: 20120125080
    Abstract: An exhaust gas sampling and analysis system includes a main flow channel in which a flow restriction mechanism and a first suction pump are arranged; a measurement flow channel in which an exhaust gas analysis device is provided and that extends from the main flow channel at a position downstream of the flow restriction mechanism; and a compensation flow channel in which a flow rate adjustment mechanism is provided and that extends from the main flow channel at a position downstream of the point from which the measurement flow channel extends. The first suction pump further reduces the pressure of the exhaust gas. The flow rate adjustment mechanism adjusts, in order that the pressure of the exhaust gas at the point from which the measurement flow channel extends is a predetermined value, the flow rate of the compensation gas.
    Type: Application
    Filed: July 27, 2010
    Publication date: May 24, 2012
    Applicant: HORIBA, LTD.
    Inventors: Montajir Rahman, Takeshi Kusaka, Leslie Hill
  • Publication number: 20110285998
    Abstract: This invention makes it possible to measure a concentration of a gas component having the adsorption even thought the concentration is low, and to improve a response speed of the measurement of the concentration, and comprises a body that has an introduction port to introduce a sample gas into a measurement cell, a laser light irradiation part that irradiates the laser light on the measurement cell, a heating pipe that applies heat to the sample gas introduced into the introduction port, a flow rate limit part that makes the sample gas at a negative pressure and that introduces the negative-pressurized heated sample gas into the body, and a negative pressure pump that keeps inside of the measurement cell and a flow channel from a downstream side of the flow rate limit part to the measurement cell at the negative pressure.
    Type: Application
    Filed: May 17, 2011
    Publication date: November 24, 2011
    Applicant: HORIBA, LTD.
    Inventors: Kenji Hara, Montajir Rahman, Shigeru Nakatani, Masahiro Nakane