Patents by Inventor Moon-kyu LEE

Moon-kyu LEE has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11991347
    Abstract: Provided is an image processing device configured to compress first image data. The image processing device includes an encoding circuit configured to compress the first image data into second image data including prediction data and residual data, compress the second image data into third image data by performing entropy encoding on the second image data, generate a header representing a compression ratio of the third image data, and store the third image data along with the header in a memory device as compressed first image data.
    Type: Grant
    Filed: July 16, 2021
    Date of Patent: May 21, 2024
    Assignee: SAMSUNG ELECTRONICS CO., LTD.
    Inventors: Sung Ho Jun, Chang Soo Park, Moon Kyu Song, Kyung Koo Lee, Kil Whan Lee, Hyuk Jae Jang, Kyung Ah Jeong
  • Patent number: 8625090
    Abstract: A method and an apparatus for inspecting a substrate are provided. The method includes irradiating light to a semiconductor device formed on a substrate and detecting light reflected from the semiconductor device in order to inspect a defect of the semiconductor device. An irradiation position of the light may gradually move from a semiconductor device formed at the center of the substrate to a semiconductor device formed on an edge of the substrate. at least one semiconductor device formed on a substrate, a light irradiating member which irradiates light onto the semiconductor surface formed on the substrate; a light detecting member which detects light reflected from the semiconductor device in order to inspect the semiconductor device for defects; and an irradiation position of the light gradually moves from a semiconductor device formed at the center of the substrate to a semiconductor device formed on an edge of the substrate.
    Type: Grant
    Filed: September 6, 2011
    Date of Patent: January 7, 2014
    Assignee: Samsung Electronics Co., Ltd.
    Inventors: Moon-kyu Lee, Cheongsoo Kim
  • Publication number: 20130275299
    Abstract: Provided are systems and methods for electronic receipt management using a user terminal which includes an electronic wallet where payment information is stored, an electronic receipt application storing and managing an electronic receipt, an installation number generated to determine what number of application is installed when the electronic receipt application is installed, a dongle including a payment request relay unit requesting an installation number and payment information to the user terminal to transfer received installation number, payment information, and the amount of requested payment to a payment server, a payment unit making a payment using the payment information and the amount of requested payment received from the payment request relay unit and an electronic receipt issuing unit issuing an electronic receipt when the payment unit makes a payment and transferring the issued electronic receipt and the installation number received from the payment request relay unit to an electronic receipt se
    Type: Application
    Filed: February 5, 2013
    Publication date: October 17, 2013
    Applicant: SHINSEGAE I&C CO., LTD
    Inventors: Yun Ji Yang, Moon Kyu Lee, Kee Beom Cho, Sang Hoon Kim
  • Publication number: 20120069330
    Abstract: A method and an apparatus for inspecting a substrate are provided. The method includes irradiating light to a semiconductor device formed on a substrate and detecting light reflected from the semiconductor device in order to inspect a defect of the semiconductor device. An irradiation position of the light may gradually move from a semiconductor device formed at the center of the substrate to a semiconductor device formed on an edge of the substrate. at least one semiconductor device formed on a substrate, a light irradiating member which irradiates light onto the semiconductor surface formed on the substrate; a light detecting member which detects light reflected from the semiconductor device in order to inspect the semiconductor device for defects; and an irradiation position of the light gradually moves from a semiconductor device formed at the center of the substrate to a semiconductor device formed on an edge of the substrate.
    Type: Application
    Filed: September 6, 2011
    Publication date: March 22, 2012
    Applicant: SAMSUNG ELECTRONICS CO., LTD.
    Inventors: Moon-kyu LEE, Cheongsoo KIM