Patents by Inventor Mordechai Ben-Zeev

Mordechai Ben-Zeev has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7239969
    Abstract: A system and related method for generating a test signal with controllable amounts of signal jitter includes a pattern generator, a programmable arbitrary waveform generator (AWG) and a phase modulator. The pattern generator is configured to generate a data signal characterized by a given data pattern, bit rate and pattern length. A trigger signal representative of initial timing information associated with the data signal is provided to the AWG which subsequently generates a modulation signal with a frequency equal to the bit rate divided by the pattern length of the data signal. This modulation signal is provided to the phase modulator, along with a reference clock signal, and the phase modulator generates a modulated clock signal controlled by a phase modulation means (e.g., a controllable delay line) fed by the modulation signal.
    Type: Grant
    Filed: November 9, 2004
    Date of Patent: July 3, 2007
    Assignee: Guide Technology, Inc.
    Inventors: Sassan Tabatabaei, Michael Lee, Mordechai Ben-Zeev
  • Patent number: 7203610
    Abstract: Methods for estimating data-dependent jitter (DDJ) from measured samples of a transmitted data signal include a first exemplary step of obtaining a plurality of measurements (e.g., time tags and event counts for selected pulse widths in the data signal). Such measurements may be obtained at predetermined intervals within a transmitted signal or may be obtained at randomly selected intervals, and should yield measurements for each data pulse in a repeating data pattern. An average unit interval value representative of the average bit time of the transmitted signal is determined. Time interval error estimates representative of the timing deviation from each signal edge's measured value relative to its ideal value (determined in part from the calculated average unit interval value) are also determined, as well as a classification for each measured signal edge relative to a corresponding data pulse in the repeating data pattern.
    Type: Grant
    Filed: August 31, 2004
    Date of Patent: April 10, 2007
    Assignee: Guide Technology, Inc.
    Inventors: Sassan Tabatabaei, Mordechai Ben-Zeev, Paul Frederick Miller
  • Publication number: 20060100801
    Abstract: A system and related method for generating a test signal with controllable amounts of signal jitter includes a pattern generator, a programmable arbitrary waveform generator (AWG) and a phase modulator. The pattern generator is configured to generate a data signal characterized by a given data pattern, bit rate and pattern length. A trigger signal representative of initial timing information associated with the data signal is provided to the AWG which subsequently generates a modulation signal with a frequency equal to the bit rate divided by the pattern length of the data signal. This modulation signal is provided to the phase modulator, along with a reference clock signal, and the phase modulator generates a modulated clock signal controlled by a phase modulation means (e.g., a controllable delay line) fed by the modulation signal.
    Type: Application
    Filed: November 9, 2004
    Publication date: May 11, 2006
    Inventors: Sassan Tabatabaei, Michael Lee, Mordechai Ben-Zeev
  • Publication number: 20060047450
    Abstract: Methods for estimating data-dependent jitter (DDJ) from measured samples of a transmitted data signal include a first exemplary step of obtaining a plurality of measurements (e.g., time tags and event counts for selected pulse widths in the data signal). Such measurements may be obtained at predetermined intervals within a transmitted signal or may be obtained at randomly selected intervals, and should yield measurements for each data pulse in a repeating data pattern. An average unit interval value representative of the average bit time of the transmitted signal is determined. Time interval error estimates representative of the timing deviation from each signal edge's measured value relative to its ideal value (determined in part from the calculated average unit interval value) are also determined, as well as a classification for each measured signal edge relative to a corresponding data pulse in the repeating data pattern.
    Type: Application
    Filed: August 31, 2004
    Publication date: March 2, 2006
    Inventors: Sassan Tabatabaei, Mordechai Ben-Zeev, Paul Miller