Patents by Inventor Mordechai Leska

Mordechai Leska has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8688398
    Abstract: Described herein is a method and apparatus for performing calibrations on robotic components. In one embodiment, a method for performing robotic calibrations includes moving the calibrating device across a target (e.g., a wafer chuck). Next, the method includes measuring distances between light spots from the sensors and a perimeter of the target using the sensors located on the calibrating device. Next, the method includes determining a displacement of the calibrating device relative to a center of the target. Then, the method includes determining a rotation angle of the calibrating device relative to a system of coordinates of the target. Next, the method includes calibrating a robot position of the robot based on the displacement and rotation angle of the calibrating device with respect to the target.
    Type: Grant
    Filed: June 14, 2012
    Date of Patent: April 1, 2014
    Assignee: Applied Materials, Inc.
    Inventors: Vijay Sakhare, Sekar Krishnasamy, Mordechai Leska, Donald Foldenauer, Rinat Shimshi, Marvin L. Freeman, Jeffery Hudgens, Satish Sundar
  • Publication number: 20120271590
    Abstract: Described herein is a method and apparatus for performing calibrations on robotic components. In one embodiment, a method for performing robotic calibrations includes moving the calibrating device across a target (e.g., a wafer chuck). Next, the method includes measuring distances between light spots from the sensors and a perimeter of the target using the sensors located on the calibrating device. Next, the method includes determining a displacement of the calibrating device relative to a center of the target. Then, the method includes determining a rotation angle of the calibrating device relative to a system of coordinates of the target. Next, the method includes calibrating a robot position of the robot based on the displacement and rotation angle of the calibrating device with respect to the target.
    Type: Application
    Filed: June 14, 2012
    Publication date: October 25, 2012
    Inventors: Vijay Sakhare, Sekar Krishnasamy, Mordechai Leska, Donald Foldenauer, Rinat Shimshi, Marvin L. Freeman, Jeffery Hudgens, Satish Sundar
  • Patent number: 8260461
    Abstract: Described herein is a method and system for performing calibrations on robotic components. In one embodiment, a method for performing robotic calibrations includes manually calibrating a center of a robot blade aligned with respect to a target. The method further includes recording a first positional value of the center of the robot blade aligned with respect to a camera. The method further includes automatically determining a second positional value of the center of the robot blade aligned with respect to the camera. The method further includes automatically recalibrating the robot blade based on an offset between the second positional value and the first positional value exceeding a tolerance offset from the first positional value.
    Type: Grant
    Filed: August 25, 2008
    Date of Patent: September 4, 2012
    Assignee: Applied Materials, Inc.
    Inventors: Sekar Krishnasamy, Vijay Sakhare, Mordechai Leska, Donald Foldenauer, Rinat Shimshi, Satish Sundar
  • Patent number: 8224607
    Abstract: Described herein is a method and apparatus for performing calibrations on robotic components. In one embodiment, a method for performing robotic calibrations includes moving the calibrating device across a target (e.g., a wafer chuck). Next, the method includes measuring distances between light spots from the sensors and a perimeter of the target using the sensors located on the calibrating device. Next, the method includes determining a displacement of the calibrating device relative to a center of the target. Then, the method includes determining a rotation angle of the calibrating device relative to a system of coordinates of the target. Next, the method includes calibrating a robot position of the robot based on the displacement and rotation angle of the calibrating device with respect to the target.
    Type: Grant
    Filed: August 25, 2008
    Date of Patent: July 17, 2012
    Assignee: Applied Materials, Inc.
    Inventors: Vijay Sakhare, Sekar Krishnasamy, Mordechai Leska, Donald Foldenauer, Rinat Shimshi, Marvin L. Freeman, Jeffery Hudgens, Satish Sundar
  • Publication number: 20090062959
    Abstract: Described herein is a method and apparatus for performing calibrations on robotic components. In one embodiment, a method for performing robotic calibrations includes moving the calibrating device across a target (e.g., a wafer chuck). Next, the method includes measuring distances between light spots from the sensors and a perimeter of the target using the sensors located on the calibrating device. Next, the method includes determining a displacement of the calibrating device relative to a center of the target. Then, the method includes determining a rotation angle of the calibrating device relative to a system of coordinates of the target. Next, the method includes calibrating a robot position of the robot based on the displacement and rotation angle of the calibrating device with respect to the target.
    Type: Application
    Filed: August 25, 2008
    Publication date: March 5, 2009
    Inventors: Vijay Sakhare, Sekar Krishnasamy, Mordechai Leska, Donald Foldenauer, Rinat Shimshi, Marvin L. Freeman, Jeffery Hudgens
  • Publication number: 20090062960
    Abstract: Described herein is a method and system for performing calibrations on robotic components. In one embodiment, a method for performing robotic calibrations includes manually calibrating a center of a robot blade aligned with respect to a target. The method further includes recording a first positional value of the center of the robot blade aligned with respect to a camera. The method further includes automatically determining a second positional value of the center of the robot blade aligned with respect to the camera. The method further includes automatically recalibrating the robot blade based on an offset between the second positional value and the first positional value exceeding a tolerance offset from the first positional value.
    Type: Application
    Filed: August 25, 2008
    Publication date: March 5, 2009
    Inventors: Sekar Krishnasamy, Vijay Sakhare, Mordechai Leska, Donald Foldenauer, Rinat Shimshi