Abstract: A non-transitory processor-readable medium stores code representing instructions to be executed by a processor. The code causes the processor to receive, from a client device, a request for a service associated with a set of compute devices. The processor is caused to define a normalized request, based on a metadata associated with service requirements. The processor is caused to define a translated request for a compute device from the set of compute devices based on the normalized request. The processor is caused to send the translated request to the compute device in accordance with an endpoint interface associated with a format of the translated request. The processor is caused to receive data associated with the service from the compute device, in response to the translated request. The processor is caused to send, to the client device, a response having a format associated with the client device based on the data.

Abstract: A non-transitory processor-readable medium stores code representing instructions to be executed by a processor. The code causes the processor to receive, from a client device, a request for a service associated with a set of compute devices. The processor is caused to define a normalized request, based on a metadata associated with service requirements. The processor is caused to define a translated request for a compute device from the set of compute devices based on the normalized request. The processor is caused to send the translated request to the compute device in accordance with an endpoint interface associated with a format of the translated request. The processor is caused to receive data associated with the service from the compute device, in response to the translated request. The processor is caused to send, to the client device, a response having a format associated with the client device based on the data.

Abstract: A method includes defining a hierarchy associated with a test system including a plurality of test units for testing integrated circuit devices. At least some of the test units have a plurality of sockets. The hierarchy includes a first level including a first plurality of entities each associated with one of the sockets and at least a second level including a second plurality of entities each associated with a grouping of the sockets. State data associated with operational states of the sockets is received. A set of state metrics is generated for each entity at each level of the hierarchy based on the state data. Each set of state metrics identifies time spent in the operational states.

Abstract: A method includes defining a hierarchy associated with a test system including a plurality of test units for testing integrated circuit devices. At least some of the test units have a plurality of sockets. The hierarchy includes a first level including a first plurality of entities each associated with one of the sockets and at least a second level including a second plurality of entities each associated with a grouping of the sockets. State data associated with operational states of the sockets is received. A set of state metrics is generated for each entity at each level of the hierarchy based on the state data. Each set of state metrics identifies time spent in the operational states.