Abstract: A memory device can include first sense amplifiers coupled to bit lines of a memory array in a first access period and de-coupled from the bit lines in a first sense period, the first sense amplifiers configured to amplify data signals from the memory array in the first sense period; and second sense amplifiers coupled to the bit lines in a second access period that follows the first access period and configured to amplify data signals from the memory cell array in a second sense period that overlaps the first sense period.

Abstract: A system and method is provided for hot de-latch of a parasitic device in an integrated circuit (IC) that restores the IC to normal operation without de-powering the IC or resulting in a loss of data. In one embodiment the method, includes reducing a voltage supplied to at least a portion of the IC from a normal operation voltage to a de-latch voltage for a time to de-latch the parasitic device without de-powering the IC. Other embodiments are also disclosed.

Abstract: Disclosed is a dynamic detector to detect an environmental condition including a power-supply level relative to a predetermined threshold signal during a training phase; and an adjustable buffer, coupled with the dynamic detector, configured to adjust output drive strength during the training phase in response to the detected environmental condition.

Abstract: An integrated circuit may include at least a first replica driver stage coupled between a reference impedance input and a first power supply node and having a first programmable driver impedance set by a first driver configuration value in the same manner as a first output driver section of the integrated circuit. At least a first replica input termination stage may be coupled between the reference impedance input and the first power supply node and having a first programmable termination impedance set by a first termination configuration value in the same manner as a first input termination section of the integrated circuit. An impedance programming circuit may generate at least the first driver configuration value and the first termination configuration value in response to a potential at the reference node.

Abstract: Disclosed is an accumulation memory circuit for providing a fast read, modify, and write operation in a single clock cycle time. The memory circuit is configured to read data stored in the memory device at an address. The memory circuit includes a reconfigurable adder unit generating read, accumulate and write output in a single clock cycle. The memory circuit is further configured to minimize data overflow. A high speed accumulation method comprises resetting a memory circuit; reading from an address of the memory circuit; performing internal addition within the memory circuit and rewriting into the address of the memory circuit in a single clock cycle.

Abstract: An integrated circuit may include at least a first replica driver stage coupled between a reference impedance input and a first power supply node and having a first programmable driver impedance set by a first driver configuration value in the same manner as a first output driver section of the integrated circuit. At least a first replica input termination stage may be coupled between the reference impedance input and the first power supply node and having a first programmable termination impedance set by a first termination configuration value in the same manner as a first input termination section of the integrated circuit. An impedance programming circuit may generate at least the first driver configuration value and the first termination configuration value in response to a potential at the reference node.

Abstract: In one embodiment, an integrated circuit device includes a power on reset (POR) circuit and a stochastic reset circuit configured to control enabling and disabling of the POR circuit. The stochastic reset circuit may have a value from among many possible values. The POR circuit may be enabled during a power up sequence of the device when the value of the stochastic reset during the power up is not a value designated to allow disabling of the POR circuit. The stochastic reset circuit may be configured such that the probability of the POR circuit being disabled during the power up is extremely low. After the power up sequence, the stochastic reset circuit may be controlled to allow disabling of the POR circuit to conserve power.

Abstract: In one embodiment, an integrated circuit device includes a power on reset (POR) circuit and a stochastic reset circuit configured to control enabling and disabling of the POR circuit. The stochastic reset circuit may have a value from among many possible values. The POR circuit may be enabled during a power up sequence of the device when the value of the stochastic reset during the power up is not a value designated to allow disabling of the POR circuit. The stochastic reset circuit may be configured such that the probability of the POR circuit being disabled during the power up is extremely low. After the power up sequence, the stochastic reset circuit may be controlled to allow disabling of the POR circuit to conserve power.

Abstract: A memory device can include a group of memory cells, which can be arranged in a column (100) that receives power by way of a first cell supply nodes (106-0 to 106-m). A current limiter (110) can be situated between first cell supply nodes (106-0 to 106-m) and a power supply (VH), and limit a current (llimit) to less than a latch-up holding current (lhold_lu) for the group of memory cells (100). In a particle event, such as an ?-particle strike, a current limiter (110) can prevent a latch-up holding current (lhold_lu) from developing, thus preventing latch-up from occurring. Current limiter (110) can include p-channel transistors and/or resistors, and thus consume a relatively small area of the memory device.

Abstract: A method and apparatus comprising a first circuit configured to generate a first output in response to a first input, a second circuit configured to present a second output in response to a second input, and a third circuit configured to generate a first voltage signal and a second voltage signal in response to the first output and said second output. The first voltage signal may be above the positive supply and the second voltage signal may be below the negative supply.