Abstract: A disconnection-inspecting method for inspecting an electrical disconnection between circuits formed on both surfaces of a board is provided. The method includes the steps of: placing the board on an insulating sheet laid on a reference conductor; measuring a first capacitance between the reference conductor and one of the circuits formed on a surface of both surfaces opposite to the other surface facing the insulating sheet; measuring a second capacitance between the reference conductor and the one of the circuits by changing a first physical quantity of the insulating sheet; calculating a second physical quantity of each of the circuits based on the first capacitance and the second capacitance measured in the steps of measuring; and judging the presence of the electrical disconnection based on the second physical quantity calculated in the step of calculating.

Abstract: A disconnection-inspecting method for inspecting an electrical disconnection between circuits formed on both surfaces of a board is provided. The method comprises the steps of: placing the board on an insulating sheet laid on a reference conductor; measuring a first capacitance between the reference conductor and one of the circuits formed on a surface of both surfaces opposite to the other surface facing the insulating sheet; measuring a second capacitance between the reference conductor and the one of the circuits by changing a first physical quantity of the insulating sheet; calculating a second physical quantity of each of the circuits based on the first capacitance and the second capacitance measured in the steps of measuring; and judging the presence of the electrical disconnection based on the second physical quantity calculated in the step of calculating.

Abstract: For a print-circuit board 10 of a good product, probes 31 and 32 are made to be electrically continuous with a ground plate 13 and a wiring pattern i respectively to measure a capacitance Cgi, which is then stored in a storage device 44. A capacitance Ci of a print-circuit board 10, the object of testing, is measured in a similar manner and a ratio .mu.=(average value Ca of a several measured capacitance value of the object of testing/(average value Cga of the corresponding measured capacitance values of the good product) is calculated. If Ci<Cgj(1-.DELTA.e0) or Ci>Cgj(1+.DELTA.e0), the measured capacitance values Ci and Cgjare excluded from the objects of calculation of the average values. If Cj<.mu..Cgj(1-.DELTA.e) or Cj>.mu..Cgj(1+.DELTA.e), a wiring j is judged to be defective and the resistance measuring method is employed to judge the details of the defect. The tolerance rate .DELTA.e0 and .DELTA.e are 0.15 and 0.02 respectively.