Abstract: An electron source includes a plurality of electron emission cathodes and at least one control electrode. A gate current regulator is provided for regulation of current flowing through the at least one control electrode.

Abstract: The present subject matter relates to inspection systems, devices and methods for x-ray inspection of objects. A conveyor can move an object to be inspected through an inspection zone along a direction of travel, one or more multibeam x-ray source arrays can provide multiple collimated x-ray beams through the inspection zone along a direction substantially perpendicular to the direction of travel, and one or more x-ray detector arrays can detect x-ray beams passing through the inspection zone from the x-ray source array. X-ray signals detected by the x-ray detector array can be recorded to form multiple x-ray projection images of the object, and the multiple x-ray projection images can be processed into three-dimensional tomographic images of the object.

Abstract: Multibeam field emission x-ray systems and related methods can include cathode elements, an anode assembly spaced from the plurality of cathode elements, and an extraction gate positioned between the plurality of cathode elements and the anode assembly. A potential difference can be applied between the extraction gate and at least one of the cathode elements to cause an emission of electrons from the respective cathode elements. Emission characteristics of the cathode elements can be measured, and the potential difference between the extraction gate and at least one of the cathode elements can be adjusted based on the emission characteristics measured.

Abstract: An electron source includes a plurality of electron emission cathodes and at least one control electrode. A gate current regulator is provided for regulation of current flowing through the at least one control electrode.

Abstract: Multibeam field emission x-ray systems and related methods can include cathode elements, an anode assembly spaced from the plurality of cathode elements, and an extraction gate positioned between the plurality of cathode elements and the anode assembly. A potential difference can be applied between the extraction gate and at least one of the cathode elements to cause an emission of electrons from the respective cathode elements. Emission characteristics of the cathode elements can be measured, and the potential difference between the extraction gate and at least one of the cathode elements can be adjusted based on the emission characteristics measured.

Abstract: An x-ray imaging system has an x-ray source having an electron field emission source that emits an x-ray beam that strikes an elongated, stationary anode in an evacuated housing. A magnetic deflection system steers the electron beam between the electron field emission source and the anode, so that the electron beam can strike the anode at different locations, thereby causing x-rays to be emitted from those different locations, by controlling the degree of magnetic deflection. A radiation detector detects the x-rays after attenuation by an examination subject, and generates signals dependent on the detected radiation that represent an image of the subject.