Abstract: A high reliability instrument system includes means for applying a test condition to the instrument and for determining whether the instrument properly responds to the test condition, and means for inhibiting the generation of an instrument output in response to such testing. This provides verification that most of the instrument system components, but not the system output, are properly functioning. The system further includes means for overriding the output-inhibiting function when it is desired to test the entire instrument system including the system output. The instrument system may include a gap-type ultrasonic instrument, with the test condition comprising a pulse applied to one crystal, the effects of which are detected at the other crystal to determine sensor integrity. The system is preferably configured as a two-wire on-off instrument system, in which application of the test condition at a transmitter is controlled by signals applied to the two-wire signal loop at a remote receiver.