Patents by Inventor Morteza Safai

Morteza Safai has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20080095310
    Abstract: A method and system for identifying foreign objection (FOD) in items such as aircraft are disclosed. The item may be imaged using x-ray backscatter before and after work is performed thereon. The image taken before work may be subtracted from the image taken after the work to provide a resultant image. The resultant image may indicate the presence of any FOD. Potential FOD in the resultant image may be checked against a database of known FOD to determine the identity thereof. By finding FOD, the occurrence of catastrophes such as aircraft crashes may be mitigated.
    Type: Application
    Filed: October 17, 2006
    Publication date: April 24, 2008
    Inventors: Talion Edwards, Gary Georgeson, Morteza Safai
  • Patent number: 7315609
    Abstract: For inspecting a structure with non-destructive x-ray inspection, probes are magnetically coupled to opposing surfaces of the structure. An inspection device may be autonomous with a feedback-controlled motor and/or a positional encoder. An inspection device may include wireless operation for at least one probe. A display may be included to provide real-time visual images from an x-ray detector or an optical imager.
    Type: Grant
    Filed: January 24, 2005
    Date of Patent: January 1, 2008
    Assignee: The Boeing Company
    Inventors: Morteza Safai, Gary E. Georgeson, Michael D. Fogarty, Richard H. Bossi
  • Patent number: 7312454
    Abstract: A non-destructive inspection device has an infrared sensor for infrared thermography inspection of a structure or surface. A rotatable reflector reflects infrared light from an inspected surface to an infrared sensor. An inspecting portion of a non-destructive device is magnetically coupled to an actuating portion of the device for concerted movement of the portions. An inspection device includes both an infrared sensor for infrared imaging and an optical device such as a camera for visible light imaging.
    Type: Grant
    Filed: October 26, 2005
    Date of Patent: December 25, 2007
    Assignee: The Boeing Company
    Inventors: Morteza Safai, Gary E. Georgeson
  • Patent number: 7307431
    Abstract: A system and method for inspecting a composite structure, such as to assess thermal degradation or resin curing, are provided in which the dielectric constant of the composite structure is determined using a microwave inverse scattering technique. The dielectric constant of the composite structure may be compared to the dielectric constant of one or more sample structures to determine the presence of thermal degradation or improper curing in the structure. In this regard, a system for inspecting a composite structure comprises a transmitter, a receiver, and a controller. The transmitter may be capable transmitting microwave energy directed toward the structure. The receiver may be capable of receiving microwave energy scattered from the structure. The controller may be capable of determining a dielectric constant of the structure using an inverse scattering algorithm and comparing the dielectric constant of the structure to a dielectric constant of at least one sample structure.
    Type: Grant
    Filed: August 26, 2005
    Date of Patent: December 11, 2007
    Assignee: The Boeing Company
    Inventors: Morteza Safai, Gary E. Georgeson
  • Publication number: 20070269006
    Abstract: A system and methods for x-ray backscatter reverse engineering of structures. One embodiment includes a plurality of articulated arms attached to a movable base. Another embodiment includes a single counterweighted arm attached to a movable base. The arms include x-ray detectors. At least one x-ray source, which may be mounted on the arm(s), emits x-rays, which are backscattered off the surfaces and objects of interest and captured by the detectors to generate images of hidden objects. The present system provides improved speed and resolution over prior art systems. The system has a field-of-view and effective scanning range versatile enough to work in various orientations and in environments of various sizes. In certain embodiments the system is compact and lightweight so that it can be easily transported and used within confined spaces or in environments where weight is a consideration, such as inside or underneath aircraft. The system is also pointable and adaptable.
    Type: Application
    Filed: April 25, 2007
    Publication date: November 22, 2007
    Inventors: Morteza Safai, Gary E. Georgeson, William T. Edwards
  • Publication number: 20070269014
    Abstract: An X-ray imaging system is provided which includes an X-ray tube including, a cathode for emitting electrons; and a dynamic anode. The dynamic anode receives the electrons from the cathode and generates an X-ray beam that is non-stationary. The dynamic anode rotates between a first position where the X-ray beam is directed at a first location on an object and a second position where the X-ray beam is directed at a second location on the object to generate the non-stationary beam.
    Type: Application
    Filed: May 3, 2007
    Publication date: November 22, 2007
    Inventors: Morteza Safai, Gary E. Georgeson, William T. Edwards
  • Patent number: 7287902
    Abstract: Systems and methods for thermographically inspecting a composite material or honeycombed type structures are disclosed. In one embodiment, a system includes a thermal heat source configured to be either removably coupled to or positioned proximate to the composite material to generate a localized thermal field in a selected area of the composite material. A thermal imaging device generates a visible image of the generated thermal field.
    Type: Grant
    Filed: June 7, 2005
    Date of Patent: October 30, 2007
    Assignee: The Boeing Company
    Inventors: Morteza Safai, Gary E. Georgeson, John F. Spalding, Jr., Jeffrey G. Thompson
  • Publication number: 20070189454
    Abstract: A method and system of determining the physical dimensions and configuration of a structure and/or system as a precursor to the design of modifications of the structure and/or system by analyzing hidden objects within the structure and/or system is provided. The method includes accessing the structure and/or system prior to the modification for preparation of the modification; scanning the structure and/or system with an x-ray backscatter unit; collecting data from the x-ray backscatter unit and combining and reconstructing the data into a 2-D, 2-D panoramic and/or 3-D data set; producing surfaces and structures of the hidden objects from the data set; and tying the surfaces and structures of the hidden objects into a pre-existing coordinate system of the structure and/or system creating a 3-D model.
    Type: Application
    Filed: February 10, 2006
    Publication date: August 16, 2007
    Inventors: Gary Georgeson, Morteza Safai, William Edwards
  • Publication number: 20070090294
    Abstract: Provided are systems and methods using terahertz imaging techniques for performing non-destructive inspection of a structure for detection of surface recesses. A method may involve applying a terahertz-frequency absorbing liquid to a surface of the structure, whereby the liquid will naturally tend to flow into surface recesses present in the surface of the structure, removing excess liquid from the surface of the structure which has not penetrated into existing recesses in the surface of the structure, and, after excess liquid has been removed from the surface of the structure, transmitting electromagnetic radiation in the terahertz frequency range toward the surface of the structure and detecting reflections of radiation which is not absorbed at the surface of the structure. A system may use a liquid applicator, excess liquid remover, a terahertz transmitter, and a terahertz receiver to perform a terahertz imaging non-destructive inspection operation.
    Type: Application
    Filed: October 24, 2005
    Publication date: April 26, 2007
    Inventors: Morteza Safai, Gary Georgeson
  • Publication number: 20070046298
    Abstract: A system and method for inspecting a composite structure, such as to assess thermal degradation or resin curing, are provided in which the dielectric constant of the composite structure is determined using a microwave inverse scattering technique. The dielectric constant of the composite structure may be compared to the dielectric constant of one or more sample structures to determine the presence of thermal degradation or improper curing in the structure. In this regard, a system for inspecting a composite structure comprises a transmitter, a receiver, and a controller. The transmitter may be capable transmitting microwave energy directed toward the structure. The receiver may be capable of receiving microwave energy scattered from the structure. The controller may be capable of determining a dielectric constant of the structure using an inverse scattering algorithm and comparing the dielectric constant of the structure to a dielectric constant of at least one sample structure.
    Type: Application
    Filed: August 26, 2005
    Publication date: March 1, 2007
    Inventors: Morteza Safai, Gary Georgeson
  • Publication number: 20060274812
    Abstract: Systems and methods for thermographically inspecting a composite material or honeycombed type structures are disclosed. In one embodiment, a system includes a thermal heat source configured to be either removably coupled to or positioned proximate to the composite material to generate a localized thermal field in a selected area of the composite material. A thermal imaging device generates a visible image of the generated thermal field.
    Type: Application
    Filed: June 7, 2005
    Publication date: December 7, 2006
    Applicant: The Boeing Company
    Inventors: Morteza Safai, Gary Georgeson, John Spalding, Jeffrey Thompson
  • Patent number: 7050535
    Abstract: For inspecting a structure with non-destructive x-ray laminography inspection, probes are magnetically coupled to opposing surfaces of the structure. The probes include an x-ray source and an x-ray detector which are driven to obtain inspection data that facilitates x-ray laminographic inspection of the structure. A device may be autonomous with a feedback-controlled motor and/or a positional encoder for translation of the probes. A device may include wireless operation. A display may be included to provide real-time visual images of the x-ray laminography or position information.
    Type: Grant
    Filed: January 28, 2005
    Date of Patent: May 23, 2006
    Assignee: The Boeing Company
    Inventors: Gary E. Georgeson, Morteza Safai
  • Publication number: 20060055400
    Abstract: For inspecting a structure with non-destructive x-ray inspection, probes are magnetically coupled to opposing surfaces of the structure. An inspection device may be autonomous with a feedback-controlled motor and/or a positional encoder. An inspection device may include wireless operation for at least one probe. A display may be included to provide real-time visual images from an x-ray detector or an optical imager.
    Type: Application
    Filed: January 24, 2005
    Publication date: March 16, 2006
    Inventors: Morteza Safai, Gary Georgeson, Michael Fogarty, Richard Bossi
  • Publication number: 20060056585
    Abstract: For inspecting a structure with non-destructive x-ray laminography inspection, probes are magnetically coupled to opposing surfaces of the structure. The probes include an x-ray source and an x-ray detector which are driven to obtain inspection data that facilitates x-ray laminographic inspection of the structure. A device may be autonomous with a feedback-controlled motor and/or a positional encoder for translation of the probes. A device may include wireless operation. A display may be included to provide real-time visual images of the x-ray laminography or position information.
    Type: Application
    Filed: January 28, 2005
    Publication date: March 16, 2006
    Inventors: Gary Georgeson, Morteza Safai
  • Publication number: 20060043303
    Abstract: There is provided a non-destructive inspection device having an infrared sensor for infrared thermography inspection of a structure or surface. A rotatable reflector reflects infrared light from an inspected surface to an infrared sensor. An inspecting portion of a non-destructive device is magnetically coupled to an actuating portion of the device for concerted movement of the portions. An inspection device includes both an infrared sensor for infrared imaging and an optical device such as a camera for visible light imaging.
    Type: Application
    Filed: October 26, 2005
    Publication date: March 2, 2006
    Inventors: Morteza Safai, Gary Georgeson
  • Patent number: 6605807
    Abstract: A detection system for identifying surface irregularities such as cracks, pits, scratches and holes in a part that is made of a material having a relatively high reflectivity and a relatively low emissivity such as titanium, aluminum, and silicon (such as silicon solar panels). A laser source generates a laser beam having a diameter that is approximately 50 microns or less. A scanning device scans the laser beam across the surface of the part. A surface irregularity radiates energy from said laser beam. An infrared receiver is directed at the surface of the part. The infrared receiver generates an infrared signal of the surface. A display that is connected to the infrared receiver displays the infrared signal to identify surface irregularities. Preferably, the infrared receiver is oriented at a first angle relative to a line perpendicular to the surface of the part. The first angle is preferably greater than 20 degrees and less than 30 degrees.
    Type: Grant
    Filed: October 9, 2002
    Date of Patent: August 12, 2003
    Assignee: The Boeing Company
    Inventor: Morteza Safai
  • Patent number: 6563904
    Abstract: A conveyor (12) moves a workpiece (WP) past an x-ray source (14) to detect existence and location of any undesirable material included in the workpiece, such as bones, fat, metal, etc. Thereafter, the conveyor carries the workpiece further, wherein a cutter (22) segments the detected undesirable material from the workpiece into a segmented portion (SP) having a visually distinguishable shape, such as square, round, triangular, etc. A worker stationed downstream of the cutter along the conveyor may then easily spot the segmented portion (SP) in a distinguishable shape and offload the segmented portion from the conveyor, while leaving the rest of the workpiece (WP) on the conveyor for further processing. Alternatively, a pickup device (24) may be used to automatically offload the segmented portion from the conveyor. A computer (18) keeps track of the locations of the workpiece and the segmented portion at all times.
    Type: Grant
    Filed: December 1, 2000
    Date of Patent: May 13, 2003
    Assignee: FMC Technologies, Inc.
    Inventors: Corneel Constant Wijts, Norman A. Rudy, Morteza Safai, Arthur W. Vogeley
  • Publication number: 20030034282
    Abstract: A color sorting apparatus is provided, which defines a sorting area through which the products to be sorted pass. The apparatus includes: a background formed by a liquid crystal display (LCD) located adjacent to the sorting area; an optical sensor located across the sorting area from the background; and a processor coupled to the optical sensor. The optical sensor senses the radiation output from the background and the radiation reflected from and/or transmitted through the products passing through the sorting area, and generates a radiation signal indicative of the sensed radiation. The processor receives the radiation signal from the optical sensor, determines whether the received signal falls outside a predefined range of acceptable signals, and if so, identifies a portion of the products corresponding to the signal outside the predefined range. The apparatus may further include a feedback system to compensate for color/intensity drifting in the background during sorting operation.
    Type: Application
    Filed: August 16, 2001
    Publication date: February 20, 2003
    Applicant: FMC Technologies, Inc.
    Inventor: Morteza Safai
  • Publication number: 20030030002
    Abstract: A detection system for identifying surface irregularities such as cracks, pits, scratches and holes in a part that is made of a material having a relatively high reflectivity and a relatively low emissivity such as titanium, aluminum, and silicon (such as silicon solar panels). A laser source generates a laser beam having a diameter that is approximately 50 microns or less. A scanning device scans the laser beam across the surface of the part. A surface irregularity radiates energy from said laser beam. An infrared receiver is directed at the surface of the part. The infrared receiver generates an infrared signal of the surface. A display that is connected to the infrared receiver displays the infrared signal to identify surface irregularities. Preferably, the infrared receiver is oriented at a first angle relative to a line perpendicular to the surface of the part. The first angle is preferably greater than 20 degrees and less than 30 degrees.
    Type: Application
    Filed: October 9, 2002
    Publication date: February 13, 2003
    Inventor: Morteza Safai
  • Publication number: 20020067797
    Abstract: A conveyor (12) moves a workpiece (WP) past an x-ray source (14) to detect existence and location of any undesirable material included in the workpiece, such as bones, fat, metal, etc. Thereafter, the conveyor carries the workpiece further, wherein a cutter (22) segments the detected undesirable material from the workpiece into a segmented portion (SP) having a visually recognizable shape, such as square, round, triangular, etc. A worker stationed downstream of the cutter along the conveyor may then easily spot the segmented portion (SP) in a recognizable shape and offload the segmented portion from the conveyor, while leaving the rest of the workpiece (WP) on the conveyor for further processing. Alternatively, a pickup device (24) may be used to automatically offload the segmented portion from the conveyor. A computer (18) keeps track of the locations of the workpiece and the segmented portion at all times.
    Type: Application
    Filed: December 1, 2000
    Publication date: June 6, 2002
    Applicant: FMC Corporation
    Inventors: Morteza Safai, Arthur W. Vogeley