Patents by Inventor Morton Kaye

Morton Kaye has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Opto-mechanical measuring system
    Patent number: 4176460
    Abstract: A measuring system includes mechanical measuring arms, adapted to engage an object to be measured, and mounted to control the positions of the vanes positioned to intercept beams of light in an optical system. The optical system includes a light beam directed to a plurality of photodetectors, whereby when the vane intercepts the light beam, the outputs of the photodetectors is a digital representation of the dimension being measured.
    Type: Grant
    Filed: July 13, 1977
    Date of Patent: December 4, 1979
    Inventor: Morton Kaye
  • Optical measurement system
    Patent number: 4113389
    Abstract: A microscope-projector system is employed to image and view a transition of light and dark areas on an object. The position of the shadow corresponds to the vertical position of a portion of the object, and an adjustable device is employed for adjusting the position of the microscope-projector with respect to the object. A video camera may be connected to the microscope, to project the image on a monitor. Vertical adjustment of the microscope-projector assembly enables measurement of thickness, for example, with respect to a reference level. The scan lines of the video camera may also be employed to locate the position of the shadow to indicate the thickness of the object, and also to automatically readjust the position of the shadow to a reference level. Electronic circuitry may also play a part to determine from transition in scan lines the horizontal dimensions of an object.
    Type: Grant
    Filed: April 19, 1976
    Date of Patent: September 12, 1978
    Inventor: Morton Kaye
  • Opto-mechanical measuring system
    Patent number: 4112579
    Abstract: A measuring system includes mechanical measuring arms, adapted to engage an object to be measured, and mounted to control the positions of the vanes positioned to intercept beams of light in an optical system. The optical system includes a light beam directed to a plurality of photodetectors, whereby when the vane intercepts the light beam, the outputs of the photodetectors is a digital representation of the dimension being measured.
    Type: Grant
    Filed: August 12, 1976
    Date of Patent: September 12, 1978
    Inventor: Morton Kaye
  • Measurement system
    Patent number: RE31143
    Abstract: A microscope-projector system is employed to image and view a transition of light and dark areas on an object. The position of the shadow corresponds to the vertical position of a portion of the object, and an adjustable device is employed for adjusting the position of the microscope-projector with respect to the object. A video camera may be connected to the microscope, to project the image on a monitor. Vertical adjustment of the microscope-projector assembly enables measurement of thickness, for example, with respect to a reference level. The scan lines of the video camera may also be employed to locate the position of the shadow to indicate the thickness of the object, and also to automatically readjust the position of the shadow to a reference level. Electronic circuitry may also play a part to determine from transition in scan lines the horizontal dimensions of an object.
    Type: Grant
    Filed: January 28, 1980
    Date of Patent: February 8, 1983
    Inventors: Morton Kaye, deceased, by Sylvia Kaye, executrix