Abstract: A method for processing articles using a microwave heating system includes obtaining an operating profile for heating a type of article using the microwave heating system. The operating profile includes a temperature-time profile for a target F0 value and a group of set point values for achieving the temperature-time profile, the group of set point values including a target for a control parameter of the microwave heating system. Using a control system operatively coupled to the microwave heating system, the microwave heating system is operated in accordance with the group of set point values such that each of the articles achieves an F0 value that is greater than or equal to the target F0 value.

Abstract: A method for processing articles using a microwave heating system includes obtaining an operating profile for heating a type of article using the microwave heating system. The operating profile includes a temperature-time profile for a target F0 value and a group of set point values for achieving the temperature-time profile, the group of set point values including a target for a control parameter of the microwave heating system. Using a control system operatively coupled to the microwave heating system, the microwave heating system is operated in accordance with the group of set point values such that each of the articles achieves an F0 value that is greater than or equal to the target F0 value.

Abstract: A method for processing articles using a microwave heating system includes obtaining an operating profile for heating a type of article using the microwave heating system. The operating profile includes a temperature-time profile for a target F0 value and a group of set point values for achieving the temperature-time profile, the group of set point values including a target for a control parameter of the microwave heating system. Using a control system operatively coupled to the microwave heating system, the microwave heating system is operated in accordance with the group of set point values such that each of the articles achieves an F0 value that is greater than or equal to the target F0 value.

Abstract: A method and system for forming a packaged product (100) and ensuring that the packaged product (100) is adequately filled. In one aspect, the method includes forming a product (101); introducing the product (101) into a package (103), thereby forming a packaged product (100); obtaining an x-ray image (201) of the packaged product (100); analyzing the x-ray image (201) utilizing a processor (118) to identify whether bounded contours (200) exist in the x-ray image (201) for each of the bounded contours (200), the processor (118) determining whether the bounded contour (200) is a threshold defect based at least in part on bounded area (208) of the bounded contour (200) for each of the threshold defects, the processor (118) classifying the threshold defect as one of a plurality of pre-determined defect types; and determining a source of at least one of the threshold defects in the packaged product (100) based at least in part on the classification of the at least one of the threshold defects.

Abstract: A method and system for forming a packaged product (100) and ensuring that the packaged product (100) is adequately filled. In one aspect, the method includes forming a product (101); introducing the product (101) into a package (103), thereby forming a packaged product (100); obtaining an x-ray image (201) of the packaged product (100); analyzing the x-ray image (201) utilizing a processor (118) to identify whether bounded contours (200) exist in the x-ray image (201) for each of the bounded contours (200), the processor (118) determining whether the bounded contour (200) is a threshold defect based at least in part on bounded area (208) of the bounded contour (200) for each of the threshold defects, the processor (118) classifying the threshold defect as one of a plurality of pre-determined defect types; and determining a source of at least one of the threshold defects in the packaged product (100) based at least in part on the classification of the at least one of the threshold defects.