Abstract: An address decoder for a source node in a multi-chip system is disclosed, which can perform parallel decoding steps to determine whether a transaction from the source node is addressed to a target node in a local integrated circuit (IC) or a remote IC, and whether the source node is allowed to access that target node. Based on the outcome of both the decoding steps, the transaction can be either blocked by the address decoder, or routed to the target node. If the transaction is addressed to the remote IC, but the source node is not allowed to access the target node on the remote IC, the transaction can be terminated by the address decoder in the local IC.

Abstract: A system and method for homogeneously merging locations in a telecommunications network including: calculating a first characteristic of a carrier at a first location and a second location; determining a penalty for excluding the carrier based in part on the first characteristic; comparing the a penalty determined to a preselected value; and, if the penalty is less than the preselected value, merging the first location and the second location, thereby forming a merged location.

Abstract: A method of automatic optical self-contained inspection for detection of macro defects of sub-pixel defect size in pattern wafers and non-pattern wafers is based on surface light scattering color-intensity computerized analysis. The method includes setting-up initial calibration and deriving correction data. A wafer image is acquired and rendered and compensated for lighting intensity and optical sensor sensitivity color spectra biases and spatial variances prior to displaying the inspection results.

Abstract: A system and method for homogeneously merging locations in a telecommunications network including: calculating a characteristic of a carrier at a first location and a second location; determining a penalty for excluding the carrier based in part on the characteristic; comparing the penalty determined to a preselected value; and, if the penalty is less than the preselected value, merging the first location and the second location, thereby forming a merged location.

Abstract: A method of automatic optical self-contained inspection for detection of macro defects of sub-pixel defect size in pattern wafers and non-pattern wafers is based on surface light scattering color-intensity computerized analysis. The method includes setting-up initial calibration and deriving correction data. A wafer image is acquired and rendered and compensated for lighting intensity and optical sensor sensitivity color spectra biases and spatial variances prior to displaying the inspection results.

Abstract: Method and apparatus for detection and characterization of defects, and working order assessment of fab processing operation.

Abstract: Method and apparatus for detection and characterization of defects, and working order assessment of fab processing operation.

Abstract: A system and method for homogeneously merging locations in a telecommunications network including: calculating at least one first characteristic of at least one carrier at a first location and a second location; determining at least one penalty for excluding the at least one carrier based in part on the at least one first characteristic; comparing the at least one penalty determined to at least one preselected value; and, if the at least one penalty is less than the at least one preselected value, merging the at least one first location and the at least one second location, thereby forming at least one first merged location.

Abstract: There is provided an automatic optical inspection tool of an apparatus for residue detection on polished wafers, including an inspection tool, an illumination source, capable of instantaneous entire wafer surface illumination, colour digital camera, encompassing the entire wafers surface without eclipse, in a duple of consecutive, properly delayed imaging shots and providing appropriate image resolution for tiny residue detection, computation means, implementing image processing and manipulation algorithms to enable residue detection and characterization, logic and command operations execution and camera control, the computation means accumulating an on-line created wafer images and wafer residue defects data base, the computation means providing for inspection tool worthiness monitoring, wafer handling and transportation means. A method of automatic optical self-contained inspection for pattern wafers' polishing residue detection is also provided.

Abstract: An officer communication system and method for providing a peer-to-peer mobile and wireless network software architecture which allows mobile units or clients, administrators, and/or dispatchers to communicate information that is pertinent to law enforcement, or related services. Such information includes text, images and/or audio. For example, such information can be indicative of an officer's or suspect's location (e.g., latitude, longitude, altitude, or intersection), speed and direction of travel, an officer's assignment details, national or local bulletins, the homeland security alert level, a “live” video feed, maps or directions, etc. In one embodiment, the system via a client user interface allows for the automatic readout of intersections during a chase, and the marking on maps of special locations (e.g. locations where evidence can be found).