Abstract: A method of spectrally characterising an ink printed over another ink, and of calculating a spectral measure of reflectance of an overprint of a plurality of inks thus characterized. The method uses spectral measurements of a substrate. For an order of printing an overprint, for each ink, for a respective amount of printing of the ink, the method accepts or determines a respective interaction of absorption and reflection function (“IAR function”) indicative of how the ink interacts with a printed background and includes determining the spectral reflectance by repeatedly multiplying, in the order, for each additional ink added to a current background the spectral measure of the current background by exponentiation of the ratio of the spectral measure of the additional ink on the substrate to the spectral measure of the substrate, by the TAR function of the additional ink.

Abstract: A method of spectrally characterising an ink printed over another ink, and of calculating a spectral measure of reflectance of an overprint of a plurality of inks thus characterized. The method uses spectral measurements of a substrate. For an order of printing an overprint, for each ink, for a respective amount of printing of the ink, the method accepts or determines a respective interaction of absorption and reflection function (“IAR function”) indicative of how the ink interacts with a printed background and includes determining the spectral reflectance by repeatedly multiplying, in the order, for each additional ink added to a current background the spectral measure of the current background by exponentiation of the ratio of the spectral measure of the additional ink on the substrate to the spectral measure of the substrate, by the TAR function of the additional ink.

Abstract: Exemplary methods are directed to the linearization and characterization of an image producing device. In the method, a color test chart of the device is reproduced and measured based on a small number of color measurement fields with defined device color values. Associated color values are determined for each color measurement field and used to calculate linearization curves for the device. Additionally, by analysis of the device color values, the measured color values, and device behavior, an expanded color test chart with expanded device color values and associated expanded color values is calculated. The number of color measurement fields in the expanded color test chart is larger than the number of color measurement fields in the original color test chart. An ICC profile for the device is calculated from the expanded device color values and the expanded color values.

Abstract: The systems and methods of the present invention enable the simultaneous and automatic corrections of digital images. The systems and methods of the present invention contain an Intelligent Expert-System (IES) for processing a single digital image, selected group of digital images and a batch of digital images. The expert-system analyzes each digital image automatically, independent of any other images, extracting plurality of image characteristics, and performing image quantifications and classifications. The digital image is then corrected using fuzzy logic techniques, according to the quantifications of the various characteristics and the expert-system rule base and knowledge base. The expert system components can be customized in respect to subjective user definition and criteria.

Abstract: For the linearization and characterization of an image producing device, especially a printer, a colour test chart is reproduced and measured according to colour with the device from a relatively small number of colour measurement fields with defined device colour values, whereby associated colour values are determined for each colour measurement field. On the basis of the device colour values and the measured colour values of the test chart, linearization curves are calculated for the device and additionally by analysis of the device colour values and the measured colour values and on the basis of information on the device behaviour derived therefrom an expanded colour test chart with expanded device colour values and associated expanded colour values is calculated, whereby the number of colour measurement fields in the expanded colour test chart is significantly larger than the number of the colour measurement fields in the original colour test chart.