Patents by Inventor Moshe Langer

Moshe Langer has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20230266472
    Abstract: A method for performing active distance measurements, the method may include receiving or generating an identification of at least one target object recognized in an image; emitting, by a transmission module, one or more light pulses towards the at least one target object; directing, by an optical multiplexer of a reception module, towards at least one detector, at least one reflected light pulse that is reflected from the at least one target object; detecting, by at least one detector of the reception module, the at least one reflected light pulse; dynamically coupling, by an electrical multiplexer, the at least one detector to at least one distance measurement unit; calculating, by the one or more distance measurement units, a distance to each one of the at least one target object based on the at least one emitted light pulse and the at least one reflected light pulse.
    Type: Application
    Filed: April 20, 2023
    Publication date: August 24, 2023
    Inventors: Youval Nehmadi, Ronny Cohen, Shmuel Mangan, Zvi Nezer, Moshe Langer
  • Patent number: 11668830
    Abstract: A method for performing active distance measurements, the method may include receiving or generating an identification of at least one target object recognized in an image; emitting, by a transmission module, one or more light pulses towards the at least one target object; directing, by an optical multiplexer of a reception module, towards at least one detector, at least one reflected light pulse that is reflected from the at least one target object; detecting, by at least one detector of the reception module, the at least one reflected light pulse; dynamically coupling, by an electrical multiplexer, the at least one detector to at least one distance measurement unit; calculating, by the one or more distance measurement units, a distance to each one of the at least one target object based on the at least one emitted light pulse and the at least one reflected light pulse.
    Type: Grant
    Filed: May 28, 2019
    Date of Patent: June 6, 2023
    Assignee: VayaVision Sensing Ltd.
    Inventors: Youval Nehmadi, Ronny Cohen, Shmuel Mangan, Zvi Nezer, Moshe Langer
  • Patent number: 11292483
    Abstract: A method for managing a change in a physical property of a vehicle due to an external object that is attached to the vehicle, the method may include receiving information regarding the external object and a relationship between the external object and the vehicle; wherein at least part of the information is sensed information that is sensed by a sensor; determining, by a vehicle computer and based on the information, an effect of the external object on the vehicle; and responding to the effect of the external object on the vehicle.
    Type: Grant
    Filed: February 27, 2019
    Date of Patent: April 5, 2022
    Assignee: VayaVision Sensing, Ltd.
    Inventors: Youval Nehmadi, Ronny Cohen, Mark Wagner, Moshe Langer
  • Publication number: 20200062273
    Abstract: A method for managing a change in a physical property of a vehicle due to an external object that is attached to the vehicle, the method may include receiving information regarding the external object and a relationship between the external object and the vehicle; wherein at least part of the information is sensed information that is sensed by a sensor; determining, by a vehicle computer and based on the information, an effect of the external object on the vehicle; and responding to the effect of the external object on the vehicle
    Type: Application
    Filed: February 27, 2019
    Publication date: February 27, 2020
    Inventors: Youval Nehmadi, Ronny Cohen, Mark Wagner, Moshe Langer
  • Patent number: 9046475
    Abstract: A method, a system and a computer readable medium are provided. The method may include obtaining or receiving first area information representative of a first area of a first layer of an inspected object; wherein the inspected object further comprises a second layer that comprises a second area; wherein the second layer is buried under the first layer; directing electrons of a primary electron beam to interact with the first area; directing electrons of the primary electron beam to interact with the second area; generating detection signals responsive to electrons that were scattered or reflected from at least one of the first and second areas; and determining at least one spatial relationship between at least one feature of the first area and at least one feature of the second area based on the detection signals and on the first area information.
    Type: Grant
    Filed: May 19, 2011
    Date of Patent: June 2, 2015
    Assignee: APPLIED MATERIALS ISRAEL, LTD.
    Inventors: Moshe Langer, Ofer Adan, Ram Peltinov, Yoram Uziel, Ori Shoval
  • Patent number: 8819111
    Abstract: Requests for communications and for establishing communication sessions with an intended addressee are detected and notifications regarding the pending communication request are provided to the intended addressee. If the addressee is operating on-line in an IP environment, the messages are delivered to the addressee via a real-time mechanism. However, if the addressee is not operating on-line in an IP environment, a message is sent via an alternate means, such as SMS, email etc. For on-line addressees, if the addressee is presently running an application program, the type of application program can be ascertained and the notification message can be compatible with the rendering functions of the application program.
    Type: Grant
    Filed: April 14, 2008
    Date of Patent: August 26, 2014
    Assignee: Flash Networks, Ltd
    Inventor: Moshe Langer
  • Publication number: 20120292502
    Abstract: A method, a system and a computer readable medium are provided. The method may include obtaining or receiving first area information representative of a first area of a first layer of an inspected object; wherein the inspected object further comprises a second layer that comprises a second area; wherein the second layer is buried under the first layer; directing electrons of a primary electron beam to interact with the first area; directing electrons of the primary electron beam to interact with the second area; generating detection signals responsive to electrons that were scattered or reflected from at least one of the first and second areas; and determining at least one spatial relationship between at least one feature of the first area and at least one feature of the second area based on the detection signals and on the first area information.
    Type: Application
    Filed: May 19, 2011
    Publication date: November 22, 2012
    Inventors: Moshe Langer, Ofer Adan, Ram Peltinov, Yoram Uziel, Ori Shoval
  • Patent number: 7973919
    Abstract: A method for inspecting a region, including irradiating the region via an optical system with a pump beam at a pump wavelength. A probe beam at a probe wavelength irradiates the region so as to generate returning probe beam radiation from the region. The beams are scanned across the region at a scan rate. A detector receives the returning probe radiation, and forms an image of the region that corresponds to a resolution better than pump and probe Abbe limits of the optical system. Roles of the pump and probe beams may be alternated, and a modulation frequency of the pump beam may be changed, to produce more information. Information extracted from the probe signal can also differentiate between different materials on the region.
    Type: Grant
    Filed: April 1, 2010
    Date of Patent: July 5, 2011
    Assignee: Applied Materials Israel, Ltd.
    Inventors: Dan Grossman, Moshe Langer, Roman Kris, Silviu Reinhorn, Ron Naftali, Haim Feldman
  • Publication number: 20100188658
    Abstract: A method for inspecting a region, including irradiating the region via an optical system with a pump beam at a pump wavelength. A probe beam at a probe wavelength irradiates the region so as to generate returning probe beam radiation from the region. The beams are scanned across the region at a scan rate. A detector receives the returning probe radiation, and forms an image of the region that corresponds to a resolution better than pump and probe Abbe limits of the optical system. Roles of the pump and probe beams may be alternated, and a modulation frequency of the pump beam may be changed, to produce more information.
    Type: Application
    Filed: April 1, 2010
    Publication date: July 29, 2010
    Inventors: Dan Grossman, Moshe Langer, Roman Kris, Silviu Reinhorn, Ron Naftali, Haim Feldman
  • Patent number: 7714999
    Abstract: A method for inspecting a region, including irradiating the region via an optical system with a pump beam at a pump wavelength. A probe beam at a probe wavelength irradiates the region so as to generate returning probe beam radiation from the region. The beams are scanned across the region at a scan rate. A detector receives the returning probe radiation, and forms an image of the region that corresponds to a resolution better than pump and probe Abbe limits of the optical system. Roles of the pump and probe beams may be alternated, and a modulation frequency of the pump beam may be changed, to produce more information. Information extracted from the probe signal can also differentiate between different materials on the region.
    Type: Grant
    Filed: December 6, 2007
    Date of Patent: May 11, 2010
    Assignee: Applied Materials Israel, Ltd.
    Inventors: Dan Grossman, Moshe Langer, Roman Kris, Silviu Reinhorn, Ron Naftali, Haim Feldman
  • Patent number: 7518391
    Abstract: A method and system for defect localization including (i) receiving a test structure that includes at least one conductor that is at least partially covered by an electro-optically active material; (ii) providing an electrical signal to the conductor, so as to charge at least a portion of the conductor; and (iii) imaging the test structure to locate a defect.
    Type: Grant
    Filed: February 15, 2005
    Date of Patent: April 14, 2009
    Assignee: Applied Materials, Israel, Ltd.
    Inventors: Moshe Langer, Ehud Tirosh
  • Publication number: 20080281905
    Abstract: Requests for communications and for establishing communication sessions with an intended addressee are detected and notifications regarding the pending communication request are provided to the intended addressee. If the addressee is operating on-line in an IP environment, the messages are delivered to the addressee via a real-time mechanism. However, if the addressee is not operating on-line in an IP environment, a message is sent via an alternate means, such as SMS, email etc. For on-line addressees, if the addressee is presently running an application program, the type of application program can be ascertained and the notification message can be compatible with the rendering functions of the application program.
    Type: Application
    Filed: April 14, 2008
    Publication date: November 13, 2008
    Inventor: Moshe LANGER
  • Publication number: 20080231845
    Abstract: A method for inspecting a region, including irradiating the region via an optical system with a pump beam at a pump wavelength. A probe beam at a probe wavelength irradiates the region so as to generate returning probe beam radiation from the region. The beams are scanned across the region at a scan rate. A detector receives the returning probe radiation, and forms an image of the region that corresponds to a resolution better than pump and probe Abbe limits of the optical system. Roles of the pump and probe beams may be alternated, and a modulation frequency of the pump beam may be changed, to produce more information.
    Type: Application
    Filed: December 6, 2007
    Publication date: September 25, 2008
    Inventors: Dan Grossman, Moshe Langer, Roman Kris, Silviu Reinhorn, Ron Naftali, Haim Feldman
  • Publication number: 20050278134
    Abstract: A method and system for defect localization includes: (i) receiving a test structure that includes at least one conductor that is at least partially covered by an electro-optically active material; (ii) providing an electrical signal to the conductor, so as to charge at least a portion of the conductor; and (iii) imaging the test structure to locate a defect.
    Type: Application
    Filed: February 15, 2005
    Publication date: December 15, 2005
    Inventors: Moshe Langer, Ehud Tirosh
  • Publication number: 20030032433
    Abstract: There are disclosed systems and methods for dynamically managing resources, such as bandwidth and delay in networks, such as cellular networks. These systems and methods dynamically and automatically adjust the bandwidth and delay in individual shared access media or cells “on the fly”, to optimize user experience, usage and packet transmissions in the network.
    Type: Application
    Filed: July 26, 2001
    Publication date: February 13, 2003
    Inventors: Yoaz Daniel, Moshe Langer, Aharon Satt
  • Patent number: 5208417
    Abstract: A method and system for aiming a small caliber weapon at a target wherein a light beam is directed from the weapon towards an area of the target so as to form a light spot on an object in the target area and the light spot is imaged on a two-dimensional detector so as to form an image thereon whose displacement from an origin of the detector bears a predetermined relationship to a corresponding displacement of the object from a center of the target. The image of the light spot is projected on to a visor worn by a marksman having a reference mark thereon for visually determining the center of the target, and the cycle is repeated as required until the projected image of the light spot on the visor is coincident with the reference mark.
    Type: Grant
    Filed: December 23, 1991
    Date of Patent: May 4, 1993
    Assignee: The State of Israel, Atomic Energy Commission, Soreq Nuclear Research Center
    Inventors: Moshe Langer, Zion Azar, Uriel Halavee