Patents by Inventor Motoki Mizutani

Motoki Mizutani has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Word-line deficiency detection method for semiconductor memory device
    Patent number: 6839293
    Abstract: A semiconductor memory device having a burn-in test capability. The semiconductor memory device includes a detection circuit, which is connected to the plurality of word lines. The detection circuit detects whether a stress voltage for a burn-in test has been applied to all of the word lines along their entire lengths in the burn-in test.
    Type: Grant
    Filed: November 6, 2002
    Date of Patent: January 4, 2005
    Assignee: Fujitsu Limited
    Inventors: Satoru Kawamoto, Motoki Mizutani, Shinji Nagai, Yoshiharu Kato
  • Word-line deficiency detection method for semiconductor memory device
    Publication number: 20030058717
    Abstract: A semiconductor memory device having a burn-in test capability. The semiconductor memory device includes a detection circuit, which is connected to the plurality of word lines. The detection circuit detects whether a stress voltage for a burn-in test has been applied to all of the word lines along their entire lengths in the burn-in test.
    Type: Application
    Filed: November 6, 2002
    Publication date: March 27, 2003
    Inventors: Satoru Kawamoto, Motoki Mizutani, Shinji Nagai, Yoshiharu Kato
  • Word-line deficiency detection method for semiconductor memory device
    Patent number: 6501691
    Abstract: A semiconductor memory device having a burn-in test capability. The semiconductor memory device includes a detection circuit, which is connected to the plurality of word lines. The detection circuit detects whether a stress voltage for a burn-in test has been applied to all of the word lines along their entire lengths in the burn-in test.
    Type: Grant
    Filed: January 25, 2001
    Date of Patent: December 31, 2002
    Assignee: Fujitsu Limited
    Inventors: Satoru Kawamoto, Motoki Mizutani, Shinji Nagai, Yoshiharu Kato
  • Word-line deficiency detection method for semiconductor memory device
    Publication number: 20010009525
    Abstract: A semiconductor memory device having a burn-in test capability. The semiconductor memory device includes a detection circuit, which is connected to the plurality of word lines. The detection circuit detects whether a stress voltage for a burn-in test has been applied to all of the word lines along their entire lengths in the burn-in test.
    Type: Application
    Filed: January 25, 2001
    Publication date: July 26, 2001
    Applicant: Fujitsu Limited
    Inventors: Satoru Kawamoto, Motoki Mizutani, Shinji Nagai, Yoshiharu Kato