Patents by Inventor Motonobu JOKO

Motonobu JOKO has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11114836
    Abstract: The present invention relates to a semiconductor device and it is an object of the present invention to provide a semiconductor device that makes it easy to change a specification on driving of a power semiconductor element or control of a protection operation thereof. The semiconductor device includes a power semiconductor element, a main electrode terminal of the power semiconductor element, a sensor section that emits a signal corresponding to a physical state of the power semiconductor element, a sensor signal terminal connected to the sensor section, a drive terminal that supplies power to drive the power semiconductor element and a case that accommodates the power semiconductor element, the main electrode terminal, the sensor section, the sensor signal terminal and the drive terminal, and the sensor signal terminal and the drive terminal are provided so as to be connectable from outside the case.
    Type: Grant
    Filed: April 8, 2016
    Date of Patent: September 7, 2021
    Assignee: Mitsubishi Electric Corporation
    Inventors: Rei Yoneyama, Fumitaka Tametani, Manabu Matsumoto, Haruhiko Takemoto, Hiroshi Yoshida, Motonobu Joko
  • Patent number: 10861756
    Abstract: A semiconductor device comprises a power device, a sensor which measures a physical state of the power device to transmit a signal according to the physical state, and a main electrode terminal through which a main current of the power device flows. The semiconductor device further comprises a sensor signal terminal connected to the sensor for receiving a signal from the sensor, a driving terminal which receives driving power for driving the power device, and an open bottomed case which houses the power device, the sensor, the main electrode terminal, the sensor signal terminal and the driving terminal. The first and second terminals electrically conduct with each other to form a double structure. Also, the sensor signal terminal and the driving terminal each have a first terminal and a second terminal which are not embedded within the case.
    Type: Grant
    Filed: February 6, 2019
    Date of Patent: December 8, 2020
    Assignee: Mitsubishi Electric Corporation
    Inventors: Motonobu Joko, Rei Yoneyama
  • Publication number: 20190172763
    Abstract: A semiconductor device comprises a power device, a sensor which measures a physical state of the power device to transmit a signal according to the physical state, and a main electrode terminal through which a main current of the power device flows. The semiconductor device further comprises a sensor signal terminal connected to the sensor for receiving a signal from the sensor, a driving terminal which receives driving power for driving the power device, and an open bottomed case which houses the power device, the sensor, the main electrode terminal, the sensor signal terminal and the driving terminal. The first and second terminals electrically conduct with each other to form a double structure. Also, the sensor signal terminal and the driving terminal each have a first terminal and a second terminal which are not embedded within the case.
    Type: Application
    Filed: February 6, 2019
    Publication date: June 6, 2019
    Applicant: Mitsubishi Electric Corporation
    Inventors: Motonobu JOKO, Rei YONEYAMA
  • Patent number: 10290555
    Abstract: A semiconductor device comprises a power device, a sensor which measures a physical state of the power device to transmit a signal according to the physical state, and a main electrode terminal through which a main current of the power device flows. The semiconductor device further comprises a sensor signal terminal connected to the sensor for receiving a signal from the sensor, a driving terminal which receives driving power for driving the power device, and an open bottomed case which houses the power device, the sensor, the main electrode terminal, the sensor signal terminal and the driving terminal. The first and second terminals electrically conduct with each other to form a double structure. Also, the sensor signal terminal and the driving terminal each have a first terminal and a second terminal which are not embedded within the case.
    Type: Grant
    Filed: December 9, 2016
    Date of Patent: May 14, 2019
    Assignee: Mitsubishi Electric Corporation
    Inventors: Motonobu Joko, Rei Yoneyama
  • Publication number: 20170330810
    Abstract: Provided are a power device, a sensor which measures a physical state of the power device to transmit a signal according to the physical state, a main electrode terminal through which a main current of the power device flows, a sensor signal terminal which is connected to the sensor to receive a signal from the sensor, a driving terminal which receives driving power for driving the power device, and an open bottomed case which houses the power device, the sensor, the main electrode terminal, the sensor signal terminal and the driving terminal, the sensor signal terminal and the driving terminal each having a first terminal and a second terminal which are provided away from an inner side wall surface of the case, the first and second terminals electrically conducting to each other to form a double structure.
    Type: Application
    Filed: December 9, 2016
    Publication date: November 16, 2017
    Applicant: Mitsubishi Electric Corporation
    Inventors: Motonobu JOKO, Rei YONEYAMA
  • Patent number: 9647443
    Abstract: A fuse, a resistor, and a transistor, which serve as an abnormality history setting unit, are provided in series between external terminals. The transistor receives a specific abnormality detection signal on its base from an abnormality detection circuit. The specific abnormality detection signal becomes “H” level in order to bring the transistor into an on state when a specific abnormal phenomenon to be detected occurs out of plural types of abnormal phenomena. The abnormality history setting unit executes an abnormality history operation for turning on the transistor and allowing a current exceeding a disconnection level to flow through the fuse provided between the external terminals to disconnect the fuse.
    Type: Grant
    Filed: June 3, 2014
    Date of Patent: May 9, 2017
    Assignee: Mitsubishi Electric Corporation
    Inventor: Motonobu Joko
  • Publication number: 20170063071
    Abstract: The present invention relates to a semiconductor device and it is an object of the present invention to provide a semiconductor device that makes it easy to change a specification on driving of a power semiconductor element or control of a protection operation thereof. The semiconductor device includes a power semiconductor element, a main electrode terminal of the power semiconductor element, a sensor section that emits a signal corresponding to a physical state of the power semiconductor element, a sensor signal terminal connected to the sensor section, a drive terminal that supplies power to drive the power semiconductor element and a case that accommodates the power semiconductor element, the main electrode terminal, the sensor section, the sensor signal terminal and the drive terminal, and the sensor signal terminal and the drive terminal are provided so as to be connectable from outside the case.
    Type: Application
    Filed: April 8, 2016
    Publication date: March 2, 2017
    Applicant: Mitsubishi Electric Corporation
    Inventors: Rei YONEYAMA, Fumitaka TAMETANI, Manabu MATSUMOTO, Haruhiko TAKEMOTO, Hiroshi YOSHIDA, Motonobu JOKO
  • Publication number: 20150116885
    Abstract: A fuse, a resistor, and a transistor, which serve as an abnormality history setting unit, are provided in series between external terminals. The transistor receives a specific abnormality detection signal on its base from an abnormality detection circuit. The specific abnormality detection signal becomes “H” level in order to bring the transistor into an on state when a specific abnormal phenomenon to be detected occurs out of plural types of abnormal phenomena. The abnormality history setting unit executes an abnormality history operation for turning on the transistor and allowing a current exceeding a disconnection level to flow through the fuse provided between the external terminals to disconnect the fuse.
    Type: Application
    Filed: June 3, 2014
    Publication date: April 30, 2015
    Applicant: MITSUBISHI ELECTRIC CORPORATION
    Inventor: Motonobu JOKO