Patents by Inventor Motoo Ueda

Motoo Ueda has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8362791
    Abstract: A test apparatus includes: test modules that communicate with the device under test to test the device under test; additional modules connected between the device under test and the test modules, each additional module performing a communication with the device under test, the communication being at least one of a communication performed at a higher speed and a communication performed with a lower latency, in comparison with a communication performed by the test modules; a test head having a plurality of connectors that connect the test modules and the additional modules, respectively, the test modules and the additional modules are mounted on the test head; a performance board placed on the test head that connects between at least a part of terminals of the plurality of connectors and the device under test. The test modules are connected to the additional modules without through the performance board.
    Type: Grant
    Filed: September 10, 2009
    Date of Patent: January 29, 2013
    Assignee: Advantest Corporation
    Inventors: Motoo Ueda, Satoshi Iwamoto, Masaru Goishi, Hiroyasu Nakayama, Masaru Tsuto
  • Patent number: 7961629
    Abstract: A test apparatus, which is for testing a device under test including a receiving circuit for receiving signals transmitted through a communication cable, includes: a waveform generating section for outputting waveform data to define a waveform to be provided to an input terminal of a receiving circuit; a digital filter having the filter characteristic substantially reverse to the attenuation characteristic of the communication cable, for outputting amplified waveform data obtained by amplifying the waveform data; a DA converter for converting the amplified waveform data to an analog waveform; and a low-pass filter having the attenuation characteristic substantially same as that of the communication cable, for attenuating the analog waveform and providing the same to the receiving circuit.
    Type: Grant
    Filed: April 30, 2007
    Date of Patent: June 14, 2011
    Assignee: Advantest Corporation
    Inventor: Motoo Ueda
  • Publication number: 20100102840
    Abstract: A test apparatus includes: test modules that communicate with the device under test to test the device under test; additional modules connected between the device under test and the test modules, each additional module performing a communication with the device under test; the communication being at least one of a communication performed at a higher speed and a communication performed with a lower latency, in comparison with a communication performed by the test modules; a test head having a plurality of connectors that connect the test modules and the additional modules, respectively, the test modules and the additional modules are mounted on the test head; a performance board placed on the test head that connects between at least a part of terminals of the plurality of connectors and the device under test. The test modules are connected to the additional modules without through the performance board.
    Type: Application
    Filed: September 10, 2009
    Publication date: April 29, 2010
    Applicant: ADVANTEST CORPORATION
    Inventors: Motoo UEDA, Satoshi Iwamoto, Masaru Goishi, Hiryoyasu Nakayama, Masaru Tsuto
  • Publication number: 20080239966
    Abstract: A test apparatus for testing a device under test including a receiving circuit for receiving signals transmitted through a communication cable is provided. The test apparatus includes: a waveform generating section for outputting waveform data to define a waveform to be provided to an input terminal of a receiving circuit; a digital filter having the filter characteristic substantially reverse to the attenuation characteristic of the communication cable, for outputting amplified waveform data obtained by amplifying the waveform data; a DA converter for converting the amplified waveform data to an analog waveform; and a low-pass filer having the attenuation characteristic substantially same as that of the communication cable, for attenuating the analog waveform and providing the same to the receiving circuit.
    Type: Application
    Filed: April 30, 2007
    Publication date: October 2, 2008
    Applicant: ADVANTEST CORPORATION
    Inventor: MOTOO UEDA
  • Publication number: 20070230355
    Abstract: A test apparatus for testing a device under test including a receiving circuit for receiving signals transmitted through a communication cable is provided. The test apparatus includes: an waveform generating section for outputting waveform data to define an waveform to be provided to an input terminal of a receiving circuit; a digital filter having the filter characteristic substantially reverse to the attenuation characteristic of the communication cable, for outputting amplified waveform data obtained by amplifying the waveform data; a DA converter for converting the amplified waveform data to an analog waveform; and a low-pass filer having the attenuation characteristic substantially the same as that of the communication cable, for attenuating the analog waveform and providing the same to the receiving circuit.
    Type: Application
    Filed: March 30, 2006
    Publication date: October 4, 2007
    Applicant: Advantest Corporation
    Inventor: Motoo Ueda