Patents by Inventor Mottito Togo

Mottito Togo has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20090158821
    Abstract: A device, method and system for measuring one or more ultrasound parameters of a suspension comprising particles dispersed in a liquid carrier comprising, an immersible devices, comprising, one or more ultrasonic probes; a reflector having staggered reflective; a housing having an opening into the housing to allow the suspension to flow into the space between the probe surface and the reflective surface; an ultrasound wave generator/receiver device; and a signal processing device.
    Type: Application
    Filed: December 20, 2007
    Publication date: June 25, 2009
    Applicant: GENERAL ELECTRIC COMPANY
    Inventors: Zongqi Sun, Shridhar Champaknath Nath, Alan M. Williams, Baskaran Ganesan, Mottito Togo, Roger Nordberg, Matthew Allen Radebach
  • Publication number: 20070222439
    Abstract: Several eddy current array probes (ECAP) with enhanced drive coil configurations are described. In one arrangement, an ECAP includes a number of EC channels and a number of drive coils. Each of the drive coils is provided for a respective one of the EC channels. The drive coils have alternating polarity with respect to neighboring drive coils. In another arrangement, an ECAP for detecting flaws in a number of scanning and orientation configurations includes at least one substrate, a number of sense coils arranged on the substrate(s), and a drive coil encompassing all of the sense coils. In another arrangement, an ECAP includes substrate, sense coils arranged in at least two rows, and at least one drive line. One drive line is provided for each pair of rows and disposed between the rows.
    Type: Application
    Filed: June 7, 2007
    Publication date: September 27, 2007
    Applicant: GENERAL ELECTRIC COMPANY
    Inventors: Changting Wang, Yuri Plotnikov, William McKnight, Shridhar Nath, Gigi Gambrell, Mottito Togo, William Hennessy, John Ertel, Shyamsunder Mandayam
  • Patent number: 7154265
    Abstract: An eddy current (EC) probe for inspecting a component is provided. The EC probe includes a tangential drive coil configured to generate a probing field for inducing eddy currents in the component, where a portion of the eddy currents are aligned parallel to an edge of the component. An axis of the tangential drive coil is aligned parallel to a surface of the component. The EC probe further includes a pair of sense coils, where an axis of the sense coils is aligned perpendicular to the surface of the component. The sense coils are configured to sense the portion of the eddy currents aligned parallel to the edge of the component.
    Type: Grant
    Filed: December 21, 2004
    Date of Patent: December 26, 2006
    Assignee: General Electric Company
    Inventors: Mottito Togo, Changting Wang, Yuri Alexeyevich Plotnikov, Shyamsunder Tondanur Mandayam, William Stewart McKnight, Walter Joseph Bantz, Ui Won Suh
  • Publication number: 20060132124
    Abstract: An eddy current (EC) probe for inspecting a component is provided. The EC probe includes a tangential drive coil configured to generate a probing field for inducing eddy currents in the component, where a portion of the eddy currents are aligned parallel to an edge of the component. An axis of the tangential drive coil is aligned parallel to a surface of the component. The EC probe further includes a pair of sense coils, where an axis of the sense coils is aligned perpendicular to the surface of the component. The sense coils are configured to sense the portion of the eddy currents aligned parallel to the edge of the component.
    Type: Application
    Filed: December 21, 2004
    Publication date: June 22, 2006
    Inventors: Mottito Togo, Changting Wang, Yuri Plotnikov, Shyamsunder Mandayam, William McKnight, Walter Bantz, Ui Suh
  • Publication number: 20060132123
    Abstract: Several eddy current array probes (ECAP) with enhanced drive coil configurations are described. In one arrangement, an ECAP includes a number of EC channels and a number of drive coils. Each of the drive coils is provided for a respective one of the EC channels. The drive coils have alternating polarity with respect to neighboring drive coils. In another arrangement, an ECAP for detecting flaws in a number of scanning and orientation configurations includes at least one substrate, a number of sense coils arranged on the substrate(s), and a drive coil encompassing all of the sense coils. In another arrangement, an ECAP includes substrate, sense coils arranged in at least two rows, and at least one drive line. One drive line is provided for each pair of rows and disposed between the rows.
    Type: Application
    Filed: December 22, 2004
    Publication date: June 22, 2006
    Inventors: Changting Wang, Yuri Plotnikov, William McKnight, Shridhar Nath, Gigi Gambrell, Mottito Togo, William Hennessy, John Ertel, Shyamsunder Mandayam