Abstract: A programmable source/measurement module for automatic test equipment is disclosed. A high resolution low frequency source, high resolution low frequency measurement capability, low resolution high frequency source, and a low resolution high frequency measurement capability are provided in a single module. The module comprises an input/output switch matrix selectively coupled to a low frequency filter block and a high frequency filter block. Each filter block may be used for either source or measurement. The filter blocks are selectively coupled to a plurality of analog-to-digital converters (ADCs) and digital-to-analog converters (DACs). The ADCs and DACs are coupled to a digital interface.

Abstract: A programmable source/measurement module for automatic test equipment is disclosed. A high resolution low frequency source, high resolution low frequency measurement capability, low resolution high frequency source, and a low resolution high frequency measurement capability are provided in a single module. The module comprises an input/output switch matrix selectively coupled to a low frequency filter block and a high frequency filter block. Each filter block may be used for either source or measurement. The filter blocks are selectively coupled to a plurality of analog-to-digital converters (ADCs) and digital-to-analog converters (DACs). The ADCs and DACs are coupled to a digital interface.

Abstract: A module comprising a programmable digital interface coupled to a signal source circuit and to a signal measurement circuit. The digital interface is implemented using one or more field programmable gate arrays (FPGAs) that provides for transmission of test measurement data to control hardware, and the reception of test source data from the control hardware. An FPGA may also be used to control the selection of operational parameters for functional blocks in the source and measurement circuits in the module.